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Rapid intersection method for STL (stereo lithography) models of products

A model and fast technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as difficult to achieve fast intersection of massive grid data, low efficiency, cumbersome intersection process, etc.

Inactive Publication Date: 2014-07-02
SHANDONG UNIV OF TECH
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Problems solved by technology

[0004] The present invention aims at technical problems such as cumbersome intersection process and low efficiency existing in the prior art, and it is difficult to realize fast intersection of massive grid data in reverse engineering, and provides a method suitable for any STL grid data, which has strong data applicability and is easy to operate. High-efficiency product STL model fast intersection method

Method used

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  • Rapid intersection method for STL (stereo lithography) models of products
  • Rapid intersection method for STL (stereo lithography) models of products
  • Rapid intersection method for STL (stereo lithography) models of products

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Embodiment Construction

[0025] Attached below Figure 1-9 The present invention is further described.

[0026] Use the C programming language to realize the intersection of triangular mesh and surface models, such as figure 1 As shown, it is the implementation flow chart of the present invention based on the scattered point cloud surface topology reconstruction program of sample point topological neighbors. Data input program 1 is responsible for reading in STL data files and creating a linked list storage structure for them to support linear order traversal of scattered point cloud data. STL model dynamic index structure construction program 2 adopts nested three-dimensional rectangles to carry out adaptive clustering and division of STL data, and its process is as follows Figure 4 As shown, the R * -Tree dynamic index structure, its data structure is as follows figure 2 As shown, the index node represents as image 3 shown. Intersecting triangular patch bounding box acquisition program 3 us...

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Abstract

The invention provides a rapid intersection method for STL (stereo lithography) models of products, and belongs to the technical field of reverse engineering of products. The method is characterized in that an STL model dynamic index structure is built based on the R*-tree; the intersection range is rapidly narrowed through the intersection detection of index node bounding boxes; an intersecting triangle patch bounding box set is accurately positioned, and topological K-nearest neighbor sorting of the set is carried out; and the intersecting line sections of triangular mesh surface models in all the bounding boxes are connected in sequence, so as to rapidly extract the intersecting lines of the surface models. Examples prove that the method can effectively improve the intersection efficiency of STL surface models with intensive data and complicated shapes, and is of great significance for the clipping and splicing of the triangular mesh surface models and numerically-controlled tool path generation in reverse engineering.

Description

technical field [0001] The invention provides a fast intersection method for a product STL model, which belongs to the technical field of product reverse engineering. Background technique [0002] The product STL (Stereo Lithography) model is widely used in the fields of product digital model reconstruction, surface subdivision modeling, rapid prototyping manufacturing and NC machining simulation because of its fast and flexible modeling and strong topology adaptability to complex shape products. In order to accurately represent the shape of the model, the STL model of the product is usually composed of massive data. Effectively improving the intersection efficiency of the STL model is of great significance for the research of surface cutting, splicing and CNC tool path generation in the reverse engineering system. [0003] Searching the existing technical literature found that Guo Kaibo et al established a triangular mesh surface model index based on the adjacency list str...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
Inventor 孙殿柱孙永伟李延瑞宋洋
Owner SHANDONG UNIV OF TECH
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