Dynamic voltage scaling system-oriented on-chip monitoring circuit

Abstract

The invention discloses a dynamic voltage scaling system-oriented on-chip monitoring circuit, which is characterized by comprising a master register circuit (1), a slave register circuit (2), a shadow register circuit (3), an error signal generation circuit (4), an in-situ error correction selector (5), a metastable state monitoring circuit (6), an error signal integration circuit (7), a restoration mode selection circuit (8) and an in-situ error restoration control signal generation circuit (9). By the dynamic voltage scaling system-oriented on-chip monitoring circuit, the influence of factors such as a process, voltage, temperature noise and the like on a main circuit can be effectively resolved into the variation of delay characteristics of a key unit and a special path to reflect the actual conditions of each part in a chip, and a dynamic voltage scaling effect is greatly improved.

Description

technical field [0001] The invention relates to an on-chip monitoring circuit, in particular to an on-chip monitoring circuit with a switchable error recovery mode for a dynamic voltage regulation system, belonging to the technical field of integrated circuits. Background technique [0002] As the size of the integrated circuit process shrinks further towards the ultra-deep submicron or even nanometer level, the power consumption per unit area of ​​the chip also increases exponentially, which makes power consumption an important factor that must be considered in addition to factors such as performance and area in integrated circuit design. question. Especially in recent years, with the increasingly widespread application of various battery-powered handheld devices and wireless sensor network node chips, various system chips have higher and higher requirements for low power consumption. How to minimize chip power consumption has become a Key problems to be solved urgently in...

AI Technical Summary

Problems solved by technology

System-level monitoring methods are mainly sensors, which can reflect the current working conditions of the system to a certain extent, but off-chip monitoring often depends on the accuracy of sensors, and it is difficult to choose reliable monitoring points, so it is difficult to truly reflect the internal status of each part of the chip.

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