Test method of PID (Potential-Induced Degradation) of solar cell module

A technology of a solar cell and a test method, which is applied in the field of solar energy applications, can solve problems such as PID testing of solar cell modules that have not yet occurred, and achieve the effects of good potential uniformity, high accuracy, and guaranteed accuracy.

Inactive Publication Date: 2012-07-11
SHANGHAI & SOLAR TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, there is no method for testing the PID of solar cell modules in China at present.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] The present invention is a kind of testing method of solar cell assembly PID, comprises the following steps:

[0033] (1) Test and record the initial data of the tested solar cell module; the initial data includes electrical performance parameters, EL defect parameters and wet leakage parameters, and the parameters are obtained by testing the electrical performance tester, EL defect tester and wet leakage tester respectively.

[0034] The specific steps are:

[0035] (1) a. Use the electrical performance tester (PASAN) with a 3A-level light source to test the electrical performance parameters of the solar cell module: turn on the power supply of the control equipment, adjust the position of the solar cell module (hereinafter referred to as the module) fixing frame and the module to be appropriate, Find the target board corresponding to the component, the front of the component faces the light source and insert it on the fixing frame. Use a suitable adapter to connect t...

Embodiment 2

[0047] The difference between this embodiment and embodiment 1 is that steps (4) to (8) are different:

[0048] (4) Start the high and low temperature experimental environment box, set the temperature to 60°C and the humidity to 60% before running; turn on the high-voltage loading equipment and debug its output voltage value to 800V, and turn on the current monitor for leakage monitoring;

[0049] (5) Continue to set the time for 100 hours, turn off the high-voltage loading equipment and the high-low temperature experimental environment box, and take it out of the high-low temperature experimental environment box after the temperature of the solar cell module to be tested drops to room temperature of 25°C;

[0050] (6) Test and record the electrical performance parameters, EL defect parameters and wet leakage parameters of the tested solar cell module as the final data;

[0051] (7) Compare the initial data and final data of the tested solar cell module, that is, compare the ele...

Embodiment 3

[0054] The difference between this embodiment and Embodiment 1 is that the temperature and humidity of the high and low temperature experimental environment box in step (4) and the output voltage value of the high-voltage loading equipment are different: in this embodiment, the output voltage value of the high-voltage loading equipment is 1000V; The temperature in the experimental environment box is 60° C., and the humidity is 60%.

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PUM

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Abstract

The invention discloses a test method of PID (Potential-Induced Degradation) of a solar cell module. The test method comprises the following steps of: (1) testing and recording initial data of a tested solar cell module; (2) installing the tested solar cell module in a high-temperature and low-temperature experimental environment box and carrying out insulated treatment between the tested solar cell module and the high-temperature and low-temperature experimental environment box; (3) polarly connecting the anode and the cathode of the tested solar cell module, which are subjected to short-circuited connection, with the cathode of high-voltage loading equipment, and connecting a frame of the solar cell module with the anode of the high-voltage loading equipment; (4) starting the high-temperature and low-temperature experimental environment box, starting the high-voltage loading equipment and debugging the high-voltage loading equipment to the output voltage value of 600-1000V, and simultaneously starting a current monitor for carrying out electric leakage monitoring; (6) testing and recording final data of the tested solar cell module; (7) comparing the initial data with the final data of the tested solar cell module and evaluating power degradation; and (8) finishing the test.

Description

technical field [0001] The invention relates to the technical field of solar energy applications, in particular to a method for testing the PID of a solar battery module. Background technique [0002] The solar cell module is composed of several solar cells sequentially welded into battery strings by welding ribbons, and the battery strings are connected at the beginning and end of the battery strings by welding. , plastic film (EVA) and polyvinyl fluoride composite film (TPT), and then formed by vacuum layer packaging. [0003] In 1978, Hoffman and Ross first proposed that high voltage stress (High Voltage Stress, HVS for short) would affect the long-term stability of solar cell modules, that is, potential-induced degradation (Potential-induced Degradation, PID for short), until 2006 , with the continuous development of science and technology, people have realized that under high voltage conditions, current leakage will bring more power loss to the solar cell module system...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26H02S50/10H02S50/15
CPCG01R31/405H02S50/10Y02E10/50
Inventor 柳国伟徐德生张宝华
Owner SHANGHAI & SOLAR TECH
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