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Image measuring instrument

A technology of image measuring instrument and computer table, which is applied in the field of measuring instruments, can solve problems such as measurement result errors, and achieve the effect of simple structure and reduced errors

Inactive Publication Date: 2012-08-22
SUZHOU EASSON OPTOELECTRONICS
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  • Summary
  • Abstract
  • Description
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Problems solved by technology

At the same time, the fixing method of the microscope is also non-adjustable. Therefore, whether the center of the microscope lens is perpendicular to the workbench can only be guaranteed by mechanical processing. However, in the process of machining, installation and measurement, the center of the lens and the workbench It is impossible for the verticality to remain unchanged, which will easily lead to errors in measurement results

Method used

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Embodiment Construction

[0010] The technical solutions of the present invention will be described in detail below, but the protection scope of the present invention is not limited to the embodiments.

[0011] An image measuring instrument, comprising a computer desk, the computer desk has a built-in control box and a computer host, and the right and left sides of the computer desk are respectively equipped with a display connected to the computer host and a marble Base, the marble base is provided with an X / Y workbench, the rear side of the marble base is centered with a marble column, the front side of the marble column is provided with a Z-axis lifting device, and the Z-axis lifting device A CCD camera connected to the host computer is fixed through the lens frame, the lower end of the CCD camera is fixedly connected to a microscope through a C-MOUNT, the lower end of the microscope is provided with a surface light source, and the Z-axis lifting device is provided with a Z-axis grating The X / Y tabl...

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Abstract

The invention discloses an image measuring instrument which comprises a lens mount, wherein the lens mount comprises a first connection plate, a second connection plate, a first lens clip and a second lens clip, the upper end of the second connection plate is hinged with the outer part of the first connection plate, the two symmetrical ball screws are fixed at the lower end of the first connection plate, the extension ends of the two ball screws are connected with the screwed holes of the inner side of the second connection plate, and the first lens clip and the second lens clip are respectively fixed at the outer parts of the two ends of the second connection plate through oval holes and bolts which are arranged on the first and second lens clips. The image measuring instrument of the invention has a simple structure, and the verticality between the center of the lens of a microscope and a workbench can be accurately adjusted during the installation and measurement processes of the instrument, so the measurement error is reduced.

Description

technical field [0001] The invention belongs to the technical field of measuring instruments, and in particular relates to an image measuring instrument, which is widely used in industries such as machinery, instruments, clocks and watches, and light industry. Background technique [0002] Image measuring instrument, also known as precision image surveying instrument, overcomes the shortcomings of traditional projectors and is a new type of high-precision, high-tech measuring instrument integrating optical, mechanical, electrical, and computer image technologies. The optical microscope performs high-magnification optical magnification imaging on the object to be measured. After the enlarged object image is sent to the computer through the CCD camera system, it can efficiently detect the contour and surface shape, size, angle and position of various complex workpieces, especially precision Microscopic inspection and quality control of parts. The measurement data can be direc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G01B11/24G01B11/26
Inventor 陆庆年
Owner SUZHOU EASSON OPTOELECTRONICS
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