Testing method and device of harmonic wave universal meter
A technology for multimeters and measurement methods, applied in multi-tester circuits, spectrum analysis/Fourier analysis, etc., can solve problems such as single function of measuring instruments
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0032] Example: see Figure 1 to Figure 5 , the present embodiment provides a kind of measuring method of harmonic multimeter, it comprises the following steps:
[0033] (1) Set a multimeter body, and set a functional circuit board inside it;
[0034] (2) On the functional circuit board, a functional test unit, a central processing unit and a power supply unit connected to each other are arranged;
[0035] (3) In the functional test unit, a signal conditioning circuit, a multimeter test circuit and a harmonic test circuit connected to each other are set; wherein the multimeter test circuit is a special integrated chip for a multimeter, and the harmonic test circuit includes Fundamental frequency test circuit and high-speed ADC acquisition circuit;
[0036] (4) A software control platform is set in the central processing unit, and the software control platform is provided with the following additional functional modules: HOLD data retention, MAX / MIN maximum / minimum value, RAN...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com