Method for rapidly preparing Ni-based superalloy electron backscatter diffraction sample

An electron backscattering and high temperature alloy technology, which is applied in the preparation of test samples and other directions, can solve the problems of difficult polishing liquid and process parameters, and achieve the effect of simple method, simple sample preparation and stable effect.

Inactive Publication Date: 2012-12-05
AVIC BEIJING INST OF AERONAUTICAL MATERIALS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The surface of the electropolished sample is flat, smooth, and without deformation layer, but it is difficult to obtain a suitable polishing solution and process parameters, and a large number of experiments and explorations are required

Method used

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  • Method for rapidly preparing Ni-based superalloy electron backscatter diffraction sample
  • Method for rapidly preparing Ni-based superalloy electron backscatter diffraction sample

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Experimental program
Comparison scheme
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Embodiment Construction

[0016] The technical scheme of the present invention will be described in further detail below in conjunction with accompanying drawing and embodiment:

[0017] The Ni-based superalloys used to prepare the EBSD samples in the following examples are DD3 alloy and DD6 alloy.

[0018] Table 1 is a list of the composition and volume ratio of the chemical etching solution used when the technical solution of the present invention is used to prepare the EBSD sample.

[0019] The Kikuchi pattern is a diffraction pattern formed by the electron beam hitting the surface of the sample in the scanning electron microscope.

[0020] Table 1: The composition and volume ratio of the chemical etching solution for preparing EBSD samples

[0021] serial number

Alloy

HF

h 2 o 2

HCl

1

DD6

1

10

30

2

DD6

1

20

30

3

DD6

1

20

50

4

DD6

1

15

...

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Abstract

The invention discloses a method for rapidly preparing a Ni-based superalloy electron backscatter diffraction (EBSD) sample. The method is characterized in that the electrolytic polishing is not required; and the sample is rapidly prepared by a chemical etching method. The method comprises the following steps of: cutting the sample by a wire cutting machine, pre-grinding the sample by using abrasive paper for metallograph, performing mechanical polishing, and etching the sample by using a chemical etchant. Kikuchi patterns of the Ni-based superalloy EBSD sample prepared by the method are clear. By the method, the disadvantages that a commonly used method for preparing an EBSD sample is complicated in electrolytic polishing sample preparation and has an unstable effect are overcome.

Description

technical field [0001] The invention relates to a method for quickly preparing an electron backscattering diffraction sample of a Ni-based superalloy, and belongs to the metallographic preparation technology of the Ni-based superalloy. Background technique [0002] Electron backscatter diffraction, hereinafter referred to as EBSD, is the most important development of material microscopic analysis technology in recent years. Its basic principle is to determine the crystal structure through the analysis of the diffraction Kikuchi band excited and formed by the electron beam on the surface of the inclined sample in the scanning electron microscope. and orientation. At present, the main application fields of EBSD analysis are: grain size analysis, texture analysis, grain boundary characteristic analysis, misorientation analysis, phase identification and phase distribution, etc. At present, EBSD analysis in our country is widely used in various research fields. In recent years,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/32
Inventor 史振学李嘉荣刘世忠韩梅
Owner AVIC BEIJING INST OF AERONAUTICAL MATERIALS
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