Method for testing quality of silicon substrate in solar battery

Abstract

The invention provides a method for testing quality of a silicon substrate in a solar battery and relates to a battery cell quality test technology. The method comprises the following steps of: after recording electrical property data and EL (Expected Loss) test images, soaking a battery cell in a water solution of hydrochloric acid and nitric acid, so as to remove silver grids on two sides of the battery cell and an aluminium back field on the back of the battery cell; then adding a proper amount of hydrofluoric acid into the solution, so as to remove a silicon nitride coating layer and a P-N node layer on the front of the battery cell, thereby obtaining the silicon substrate; measuring the electrical conduction types of two sides of the silicon substrate by utilizing a P-N type measuring instrument till non-N section parts; washing the silicon substrate with water and airing the silicon substrate; measuring the surface resistance by utilizing a four-point resistivity measuring instrument; measuring the minority carrier lifetime of the silicon substrate by utilizing a minority carrier lifetime measuring instrument, so as to obtain the quality of the silicon substrate in the solar battery; and combining the quality of the silicon substrate with the electrical property data and the EL test images, so as to determine the quality of the solar battery. The method provided by the invention has the beneficial effects that required measuring tools are common tools in the solar industry, are simple and easy to use and are simple and convenient in measurement; and the method can be used for accurately judging the quality of the silicon substrate in the solar battery and providing a more reliable basis for solar battery production and inspection.

Description

technical field [0001] The invention relates to the technical field of solar-grade silicon wafers and batteries, and further relates to the manufacturing and quality inspection technology of solar-grade silicon wafers and battery sheets, in particular to the solar battery quality inspection technology. Background technique [0002] After the solar cell is manufactured and the electrical performance is detected to be abnormal, it is necessary to analyze the abnormality of the solar cell. The existing detection methods cannot make a relatively complete analysis of the quality of the silicon substrate. The main reason is that the current online inspection of solar cells cannot provide detailed data. A detailed analysis of the solar cell segment process and the quality of the silicon substrate is impossible, that is, it is impossible to accurately analyze and locate the problems that arise, and cannot meet the needs of solar cells. Production and process improvement requirements...

AI Technical Summary

Problems solved by technology

[0002] After the solar cell is manufactured and the electrical performance is detected to be abnormal, it is necessary to analyze the abnormality of the solar cell. The existing detection methods cannot make a relatively complete analysis of the quality of the silicon substrate.

The main reason is that the current online inspection of solar cells cannot provide detailed data. A detailed analysis of the solar cell segment process and the quality of the silicon substrate is impossible, that is, it is impossible to accurately analyze and locate the problems that arise, and cannot meet the needs of solar cells. Production and Process Improvement Requirements