Optical measurement system and optical measurement device

An optical measurement system and light detection technology, which can be used in measurement devices, optical radiation measurement, photometry, etc., can solve problems such as poor wavelength repeatability and energy loss

Inactive Publication Date: 2012-12-19
CHROMA ATE
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  • Abstract
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Problems solved by technology

However, the above two known methods will cause the problems of energy loss and poor wavelength repeatability respectively.
[0005] In view of the above-mentioned defects in the prior art, how to develop an optical measurement system that is cheap, efficient and can overcome energy loss and poor wavelength repeatability is really a goal for further thinking and breakthroughs in this field. and direction

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  • Optical measurement system and optical measurement device
  • Optical measurement system and optical measurement device
  • Optical measurement system and optical measurement device

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Embodiment Construction

[0015] In order to make the present invention more clearly described, please refer to the following detailed description of the present invention and the examples included therein, so as to understand the present invention more easily.

[0016] This specification only sets forth the necessary components of the present invention, and is only used to illustrate possible embodiments of the present invention. However, the description of the specification should not limit the scope of rights of the technical essence claimed by the present invention. Unless otherwise explicitly excluded in the description, the present invention is not limited to specific methods, procedures, functions or means. It should also be understood that what is described so far is only a possible embodiment of the present invention, and any method, process, function or method similar or equivalent to the device or system described in this specification can be used in the implementation or testing of the prese...

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Abstract

The invention discloses an optical measurement system which is used for measuring the optical properties of an object to be measured; and the optical measurement system comprises the object to be measured, an optical detection module, a light guide module and an analysis module. The optical measurement system utilizes the light guide module to receive axial light from the light emitted by the object to be measured for carrying out optical property analysis. Therefore, the light intensity of the light emitted by the object to be measured can be accurately measured, and the optical properties of the axial light of the object to be measured can be obtained.

Description

technical field [0001] The invention relates to an optical measurement system, more specifically, an optical measurement system capable of simultaneously detecting the total luminous flux of an object to be measured and the optical characteristics of axial light. Background technique [0002] At present, when the light-emitting diode (LED) point measuring machine measures each object under test, it must use an integrating sphere or a large-area light sensor to measure the light energy at all angles to obtain such as total luminous flux, color temperature, color coordinates, and color rendering. Optical properties such as coefficients or spectra. As the production capacity of the DUT increases, the detection demand of the DUT also increases. [0003] However, when using an integrating sphere, its volume and edge angles are reflected multiple times, resulting in energy loss of light. Theoretically, each integrating sphere can only test one DUT at a time. Therefore, in order...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/00G01J1/04G01M11/02
Inventor 郑勗廷曾一士王遵义
Owner CHROMA ATE
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