Array antenna pattern time domain measurement method

An array antenna and time-domain measurement technology, which is applied in the antenna radiation pattern and other directions, can solve the problems of complicated test work and high test cost, and achieve the effects of accurate synthesis, reduced test time, and reduced measurement site

Inactive Publication Date: 2013-01-02
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0006] The purpose of the present invention is to overcome the shortcomings of complicated test work and high test cost in the existing broadband

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  • Array antenna pattern time domain measurement method
  • Array antenna pattern time domain measurement method
  • Array antenna pattern time domain measurement method

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Embodiment Construction

[0035] The present invention will be further described below in conjunction with drawings and embodiments.

[0036] The array model we use in the embodiment contains a total of 10 dipole units, and each dipole array unit is linearly arranged at equal intervals, and the distance between the units is d=45mm. The radius of the dipole array unit used in the model is r=1mm, which is composed of two upper and lower metal cylinders with a length of l=20mm. The interval between the upper and lower cylinders is h=1mm, and the interval part is the feed port. This embodiment takes Figure 4 The shown linear dipole array is used as an example for experiments, and the source signal frequency is 4GHz.

[0037] According to the method of the present invention, the array is illuminated with a plane wave. On the horizontal plane, start from φ=0°, illuminate every 0.5°, measure the transient response of the plane wave of each unit, and record the amplitude and phase data of the corresponding ...

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Abstract

An array antenna pattern time domain measurement method belongs to the technical field of antennas, and comprises the following steps: measuring the patterns of array antenna units firstly, irradiating the array units from different angles (theta and Phi) by uniform plane waves, measuring the transient state responses of the array units under the irradiation of the plane waves by a digital oscilloscope, normalizing the transient state responses to obtain patterns of the array units under the conditions of uniform amplitude and cophase excitation, and synthesizing the array pattern through adopting a digital signal processing technology and a superposition principle of the patterns of the array antenna unit finally. The array antenna pattern time domain measurement method has the advantages that (1) the array pattern is beneficial for the precise synthesis under the array circumstance; (2) the patterns of the array units under the random given excitation can be measured; and (3) the array scanning grain pattern can be synthesized so as to be more beneficial for obtaining the maximum gain distribution area and the scanning blind point distribution area. The array antenna pattern time domain measurement method has the characteristics of simplicity in operation and high testing efficiency, and reduces the site requirement and the testing cost at the same time.

Description

technical field [0001] The invention belongs to the technical field of antennas, and relates to an array antenna pattern measurement technology, in particular to a time-domain measurement method for an array antenna pattern. Background technique [0002] With the rise of ultra-wideband communication and ultra-wideband radar technology, wideband and ultra-wideband array antennas have been widely researched and applied due to their unique performance charms such as high gain, low sidelobe and space scanning. Different from narrowband antennas, ultra-wideband antennas work in the case of transient bandwidth, and the parameters used to describe the performance of ultra-wideband antennas must be in the time domain. In order to study the time / frequency domain characteristics of ultra-wideband antennas and improve the efficiency of antenna testing, the traditional frequency domain measurement technology can no longer meet the requirements, and the time domain measurement can obtain...

Claims

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Application Information

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IPC IPC(8): G01R29/10
Inventor 赵德双张浩然王秉中
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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