Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Fault line selection method of low current grounding system using time-frequency atom decomposition theory

A time-frequency atomic decomposition, small current grounding technology, applied in the fault location and other directions, can solve the problems of large amount of information, poor convergence, long training time, etc.

Active Publication Date: 2013-01-02
ELECTRIC POWER RES INST OF GUANGDONG POWER GRID
View PDF6 Cites 40 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

S transform is the development of continuous wavelet transform and short-time Fourier transform, which has good time-frequency characteristics, but the amount of information after decomposition is too much
At the same time, there is also a line selection method that combines the steady state quantity and the transient state quantity. [10] , such as the neural network algorithm, but this algorithm has local optimum problems, poor convergence, long training time, and relatively low reliability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fault line selection method of low current grounding system using time-frequency atom decomposition theory
  • Fault line selection method of low current grounding system using time-frequency atom decomposition theory
  • Fault line selection method of low current grounding system using time-frequency atom decomposition theory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0128] The present invention proposes a distribution network fault line selection method using the time-frequency atomic decomposition method, and its implementation flow chart is as follows Figure 8 shown.

[0129] Concrete realization of the present invention comprises the following steps:

[0130] S1 establishes the zero-sequence current database when a small current ground fault occurs in the power distribution system:

[0131] The instantaneous value u(t) of the zero-sequence voltage of the bus is greater than K u u n As a fault start condition, where K u The value is 0.15, U n For the rated voltage of the busbar, record the zero-sequence current of each feeder for 2 cycles before and after the fault start through the line selection device, and establish a zero-sequence current database;

[0132] S2 conducts time-frequency atomic decomposition on the zero-sequence current database data, and selects characteristic quantity atoms:

[0133] Applying the matching pursuit...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a fault line selection method of a low current grounding system using a time-frequency atom decomposition theory. The method comprises the following steps of: based on the time-frequency atom decomposition theory, performing sparse decomposition on zero-sequence current data in a Gabor over-complete dictionary, and then obtaining matched attenuation sinusoidal quantity atoms through optimizing and solving relevant parameters. By the time-frequency atom decomposition method, the disturbance characteristics such as start / stop moments, amplitudes, frequencies and change rules of fundamental wave and each subharmonic can be exactly obtained, and interference signals can be effectively filtered. Energy entropies of the atoms decomposed by time-frequency atoms are arranged from large to small; except from the zero-sequence transient current fundamental wave atom, atom phase angles (polarity) similar with zero-sequence current frequency of each line are compared; if the atom phase angle (polarity) similar with the zero-sequence transient frequency of the line is opposite to that of other lines, the line is the fault line; and if the atom phase angle (polarity) of each line is the same, the fault is bus fault, and the fault line is determined by the comparison result of each frequency phase angle.

Description

technical field [0001] The invention relates to a fault line selection method of a small current grounding system of a distribution network, in particular to a method for selecting a fault line of a small current grounding system by applying the time-frequency atomic decomposition theory. Background technique [0002] Most of the distribution networks in my country adopt the neutral point not directly grounded system (NUGS), that is, the small ground current system, which includes the neutral point ungrounded system (NUS), the neutral point through the arc suppression coil grounding system (NES, also Called the resonant grounding system), the neutral point is through the resistance grounding system (NRS). [0003] Our country has done a lot of research on the line selection of small current grounding faults, and proposed a variety of line selection methods, which have achieved certain results, but still can not completely achieve accurate and reliable line selection, which wi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/08
Inventor 余南华高新华杨军董蓓陈炯聪李传健蔡茂孙元章周克林李瑞
Owner ELECTRIC POWER RES INST OF GUANGDONG POWER GRID
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products