A sodium lamp guide tube processing method and product
A processing method and guide tube technology, applied in the manufacture of ships or leading wires, etc., can solve the problems of metal material adhesive film and punch easy to break, stamping parts irregularity, etc., achieve good stability, good surface, prevent sticking knot effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment 1
[0018] Example 1: Set the atmospheric atmosphere resistance heating furnace to 400°C and then send electricity to raise the temperature; after the furnace temperature reaches the set temperature, continue to keep warm for 30 minutes; open the furnace door and place the niobium wire in the central area of the furnace; close the furnace Door, keep warm for about 12 minutes after the temperature in the furnace returns to the set temperature; power off the heating furnace; open the furnace door, the wire comes out of the furnace; carry out stamping.
Embodiment 2
[0019] Example 2: Set the atmospheric atmosphere resistance heating furnace to 420°C and then send electricity to raise the temperature; after the temperature of the heating furnace reaches the set temperature, continue to keep warm for 30 minutes; open the furnace door, and place the niobium-1% zirconium alloy wire into the furnace Central area; close the furnace door, and keep warm for about 8 minutes after the temperature in the furnace returns to the set temperature; power off the heating furnace; open the furnace door, and the wire comes out of the furnace; carry out stamping.
[0020] According to calculations, the pass rate of blind hole parts stamped by the method of the present invention can reach more than 95%, which is nearly 50% higher than the pass rate of bare metal bars directly stamped, which greatly improves the difficulty of stamping and demoulding and the surface of stamping parts. The problem of easy straining improves the pass rate of stamping parts.
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More