Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for estimating parameters of conductivity second-order resistance-capacitance coupled network

A technology of resistance-capacitance coupling and network parameters, applied in the direction of fluid resistance measurement, etc., can solve problems such as ignoring or ignoring the influence of electric double layer capacitance

Inactive Publication Date: 2013-01-23
DALIAN UNIV OF TECH
View PDF3 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The literature "Cui Pengfei, Zhang Liyong, Zhong Chongquan, Li Dan. Numerical simulation of multi-frequency square wave excitation RC decoupling soft measurement. Journal of Instrumentation, 2010, 31(1): 154-160" proposed a method using multiple A non-linear least squares estimation method for the RC parameters of the RC network excited by an AC square wave of frequency, but ignores the influence of the electric double layer capacitance
Patent document "Zhou Kaidi, Zhang Liyong, Ling Jingwei, Zhong Chongquan, Li Dan. Resistance-capacitance decoupling soft measurement method based on amplitude-phase characteristic detection (ZL 201010173466.3)" adopts sinusoidal signal excitation and multi-point sampling of response signal Fit its function form, and then obtain the amplitude and phase characteristic parameters of the resistance-capacitance system, and then obtain the resistance-capacitance parameter value through the relationship between the amplitude-phase characteristics and the resistance-capacitance parameter, but this method is only for ignoring the influence of the electric double layer capacitance First-order resistance-capacitance network model

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for estimating parameters of conductivity second-order resistance-capacitance coupled network
  • Method for estimating parameters of conductivity second-order resistance-capacitance coupled network
  • Method for estimating parameters of conductivity second-order resistance-capacitance coupled network

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0064] The specific embodiments of the present invention will be described in detail below in conjunction with the technical solutions and accompanying drawings.

[0065] When measuring, set the amplitude of the sinusoidal excitation signal to be 1V, and the phase to be 0rad. Choose the frequency as ω 1 The sinusoidal signal excites the conductivity cell system, and selects 10 time points t at equal intervals within a cycle 1 , t 2 ,...,t 10 For the obtained steady-state sinusoidal response signal v o (t) Sampling, the corresponding sampling voltage value v can be obtained o1 , v o2 ,...,v o10 . Time point t of each group k , the corresponding sampling voltage value v ok (k=1, 2, ..., 10) and excitation angular frequency ω 1 Substituting into formula (1), it can be obtained that the amplitude ratio A(ω 1 ) and phase difference The overdetermined equation system of , using the solution process of the steepest descent method to make the formula (3) the minimum, then...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for estimating parameters of a conductivity second-order resistance-capacitance coupled network, and belongs to the technical field of soft measurement of the solution conductivity, wherein the measurement of the solution conductivity is converted into parameter estimation of a second-order equivalent resistance-capacitance coupled network; and the method specifically comprises the following steps of: for a conductance cell second-order resistance-capacitance system model taking lead distributed capacitance and electrical double-layer capacitance influences into account, orderly employing two sine excitation signals of different frequencies to excite the resistance-capacitance network; on the basis that the amplitude ratio and phase difference of sine response signals in relation to the sine excitation signals thereof are estimated, respectively, establishing an over-determined system related to the resistance and capacitance parameters to be estimated according to the relationship deduced between the amplitude ratio and the phase difference and the solution resistance, the lead distributed capacitance and the electrical double-layer capacitance; and then obtaining the estimated values of the resistance and capacitance parameters by a subspace confidence region optimization algorithm based on the nonlinear least square principle. The method provided by the invention is high in rate of convergence, high in estimation accuracy and good in anti-interference capability, and suitable for industrial online real-time application.

Description

technical field [0001] The invention belongs to the technical field of solution conductivity soft measurement, and relates to a parameter estimation method of a second-order equivalent resistance-capacitance coupling network of conductivity, in particular to a method for estimating the parameters of a second-order equivalent resistance-capacitance coupling network through a resistance-capacitance system when considering the influence of lead distributed capacitance and double-layer capacitance. The method of obtaining the estimated value of the resistance-capacitance parameter from the estimated value of the phase characteristic. Background technique [0002] Solution conductivity measurement is widely used in human production and life. With the continuous development of science and technology, the research on conductivity measurement at home and abroad is also deepening, and various new applications of conductivity measurement technology are also emerging. At present, the m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R27/22
Inventor 张立勇杨春华周楷棣李雄王家跃黎祖刚
Owner DALIAN UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products