Test equipment and test method of test equipment

A technology of test equipment and test methods, applied in the field of testing, can solve the problems of missed detection or false detection, high cost, low efficiency, etc., to achieve the effect of improving reliability and accuracy, and improving test efficiency

Inactive Publication Date: 2013-02-27
HUIZHOU TCL MOBILE COMM CO LTD
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  • Abstract
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Problems solved by technology

[0004] 1. It is easily affected by human factors such as human eye fatigue, resulting in missed or f

Method used

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  • Test equipment and test method of test equipment
  • Test equipment and test method of test equipment
  • Test equipment and test method of test equipment

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Embodiment Construction

[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0025] see figure 1 , figure 1 It is a structural schematic diagram of the first embodiment of the testing equipment of the present invention. The test equipment includes a host computer 101 , a signal conversion device 102 and a signal feedback device 103 .

[0026] In this embodiment, the host computer 101 is preferably a computer, and the host computer 101 is used to generate a system control signal and transmit it to the signal conversion device 102; the...

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Abstract

The invention discloses test equipment, which is used for testing LED (light emitting diode) lamp matrixes. The test equipment comprises a upper computer, a signal conversion device and a signal feedback device, wherein the upper computer is used for generating system control signals, the signal conversion device is connected with the upper computer and is used for receiving the signal control signals from the upper computer and outputting multipath TTL (transistor-transistor logic) level signals according to the system control signals, the multipath TTL level signals are used for testing the LED lamp matrixes, the signal feedback device is connected with the upper computer, and is used for measuring the current value in the LED lamp matrixes and feeding back measuring results to the upper computer, and the upper computer judges whether the LED lamp matrix test is passed or not according the measuring results. The invention also discloses a test method of the test equipment. Through adopting the mode, the test equipment and the test method of the test equipment have the advantages that the test reliability and the accuracy can be improved, and the test efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a testing device and a testing method thereof. Background technique [0002] LED (Light Emitting Diode, light-emitting diode) is a solid-state semiconductor device that can convert electrical energy into visible light. Because of its long life, high luminous efficiency, no radiation and low power consumption, it is often used in various modern In electronic design and system, to provide image display and status display functions. In many electronic devices, usually LEDs are not single, but a large number of regular combinations, such as in the form of a matrix. However, this form of existence increases the difficulty of testing them in the production process. [0003] In the prior art, the LED light matrix is ​​usually tested by visual inspection, but this testing method has the following disadvantages: [0004] 1. It is easily affected by human factors such as human eye fatigu...

Claims

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Application Information

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IPC IPC(8): G01R31/44
Inventor 张京涛管银
Owner HUIZHOU TCL MOBILE COMM CO LTD
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