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Diode chip manufacturing method

A diode and chip technology, which is applied in the field of diode chip preparation, can solve the problems affecting the working performance of the chip and the heat of the chip, and achieve the effect of improving the breakdown voltage and protecting the chip.

Active Publication Date: 2013-03-20
LESHAN JIAYANG TECH DEV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is still no good solution to the problem of increasing the reverse breakdown voltage, and with the above method, the forward conduction voltage of the chip is correspondingly increased, causing the chip to heat up, which in turn affects the working performance of the chip

Method used

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Embodiment 1

[0038] A method for preparing a diode chip, comprising an N+ layer and a P+ layer, characterized in that, the steps are as follows:

[0039] A), growing at least one N-type layer for current drift on the front side of the N+-type substrate silicon wafer;

[0040] B), growing a layer of silicon dioxide on the surface of the N-type layer;

[0041] C), coating photoresist on the silicon dioxide layer;

[0042] D), photoetching the pressure divider ring window and the main junction window on the photoresist, and etching the groove;

[0043] E), after the above step D), use the ion implantation method to generate P+ layer and P- layer, forming a closed ring with P+ layer as the main junction and at least one pressure dividing ring P- layer as the secondary junction;

[0044] F) Coating a glass passivation layer on the etched groove;

[0045] G), sputtering a nickel alloy layer on the surface of both the N+ layer and the P+ layer.

Embodiment 2

[0047] A method for preparing a diode chip, comprising an N+ layer and a P+ layer, characterized in that, the steps are as follows:

[0048] A), growing at least one N-type layer for current drift on the front side of the N+-type substrate silicon wafer;

[0049] B), growing a layer of silicon dioxide on the surface of the N-type layer;

[0050] C), coating photoresist on the silicon dioxide layer;

[0051] D), photoetching the pressure divider ring window and the main junction window on the photoresist, and etching the groove;

[0052] E), after the above step D), use the ion implantation method to generate P+ layer and P- layer, forming a closed ring with P+ layer as the main junction and at least one pressure dividing ring P- layer as the secondary junction;

[0053] F) Coating a glass passivation layer on the etched groove;

[0054] G), sputtering a nickel alloy layer on the surface of both the N+ layer and the P+ layer.

[0055] The photoresist coated in step C)...

Embodiment 3

[0057] A method for preparing a diode chip, comprising an N+ layer and a P+ layer, characterized in that, the steps are as follows:

[0058] A), growing at least one N-type layer for current drift on the front side of the N+-type substrate silicon wafer;

[0059] B), growing a layer of silicon dioxide on the surface of the N-type layer;

[0060] C), coating photoresist on the silicon dioxide layer;

[0061] D), photoetching the pressure divider ring window and the main junction window on the photoresist, and etching the groove;

[0062] E), after the above step D), use the ion implantation method to generate P+ layer and P- layer, forming a closed ring with P+ layer as the main junction and at least one pressure dividing ring P- layer as the secondary junction;

[0063] F) Coating a glass passivation layer on the etched groove;

[0064] G), sputtering a nickel alloy layer on the surface of both the N+ layer and the P+ layer.

[0065]The photoresist coated in step C) ...

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Abstract

The invention discloses a diode chip manufacturing method, and particularly relates to a fast recovery diode chip manufacturing method. A diode chip comprises an N+ layer and a P+ layer, and the diode chip manufacturing method comprises the following steps: A), growing at least one N-type layer for current drift on the front surface of an N+-type substrate wafer; B), growing a layer of silicon dioxide on the surface of the N-type layer; C), coating photoresist on the silicon dioxide; D), photoetching a voltage-dividing ring window and a main node window on the photoresist, and corroding grooves; E), after the step D), by an ion implantation method, generating a P+ layer and a P- layer, and forming a closed ring with the P+ layer as a main node and at least one voltage-dividing ring P- layer as an assistant node; and G), sputtering nickel-plated alloy layers on the surfaces of the N+ layer and the P+ layer. After adoption of the diode chip manufacturing method, the positive and reserve recovery times are short and the reverse breakdown voltage is high.

Description

technical field [0001] The invention discloses a method for preparing a diode chip, in particular, it belongs to the manufacturing method of a fast recovery diode chip. [0002] preparation method. Background technique [0003] The high-voltage diodes currently on the market are usually ordinary high-voltage diodes and fast recovery high-voltage diodes. [0004] Ordinary high-voltage diode chip single-chip reverse breakdown voltage VR is mainly 1200V-1600V, taking the commonly used 10000V high-voltage diode as an example, a single high-voltage diode needs to be assembled in series with 8-10 diode chips, and the forward conduction voltage drop (VF) is between 8- About 10V; The reverse recovery voltage VR of a single chip of a fast recovery high-voltage diode is mainly 1200V. The same 10000V fast recovery high-voltage diode is taken as an example. It needs to connect at least 10-11 chips in series, and the reverse recovery recovery time trr: 40-70ns ( Test conditions If=0.5...

Claims

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Application Information

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IPC IPC(8): H01L21/329
Inventor 邓华鲜
Owner LESHAN JIAYANG TECH DEV