Combination probe for screening multiple anomalysyndrome
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- FUDAN UNIV
- Publication Date
- 2013-04-03
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the field of biological technology, and relates to a probe for screening multiple malformation syndromes, in particular to a combined probe for multiple continuous probe amplification for screening multiple malformation syndromes. The probe can be used for preliminary screening of multiple malformation syndrome. Background technique
[0002] Congenital malformation (CA) refers to morphological or structural abnormalities that exist at birth; including single malformations (such as cleft lip, polydactyly, etc.) and multiple congenital malformations (MCA). Studies have found that there are a variety of multiple deformities that are specifically combined under the action of a certain cause and become a deformity syndrome. At present, more than 250 malformation syndromes have been identified and diagnosed in medicine; however, due to the obvious specificity and imbalance in the phenotypes of multiple malformation syndromes, it is ...