Ramp signal generation circuit and ramp signal generator

Abstract

The invention is suitable for the field of electronics, and provides a ramp signal generation circuit and a ramp signal generator. The circuit comprises an energy storage module, a reset module, and a closed-loop operational amplification module, wherein the energy storage module is used for storing energy according to the current provided by a power supply, and outputting a ramp signal; the reset module is used for discharging the energy storage module after receiving a reset control signal; and the closed-loop operational amplification module is used for increasing the energy storage value of the energy storage module. According to the ramp signal generation circuit and the ramp signal generator provided by the invention, a capacitance value is increased by increasing an equivalent ground capacitance in the condition of the same charge current so as to realize the function that a ramp signal generated a capacitor with a smaller area has the same slope with the ramp signal generated by the conventional ramp signal generation circuit, and no remarkable change of the capacitance value of the capacitor in the whole voltage swing of the ramp signal can be ensured, so that the accuracy of the ramp signal can be ensured.

Description

technical field [0001] The invention belongs to the field of electronics, and in particular relates to a ramp signal generating circuit and a ramp signal generator. Background technique [0002] The semiconductor industry generally implants relevant functional circuits in the circuit to provide self-test function technology during design, that is, built-in self-test (Built-inSelfTest, BIST), so as to reduce the dependence of device testing on automatic test equipment (ATE) degree, and in the built-in self-test of the static performance parameters of the analog-to-digital converter (ADC, analog-to-digital converter) integral nonlinearity (Integral nonlinearity, INL) and differential nonlinearity (Differential nonlinearity, DNL), often need to use To the ramp voltage signal that can cover the ADC input range, and in order to ensure a certain accuracy of the ramp signal, a fixed current is often used to charge and discharge a fixed capacitor, that is, the capacitor is charged t...

AI Technical Summary

Problems solved by technology

[0011] On the one hand, the embodiment of the present invention provides a ramp signal generation circuit, which can solve the problem that the existing ramp waveform generation circuit in the BIST needs to ensure the input sampling requirements of the ADC and the accuracy of the mirror current, resulting in excessive capacitance and chip area.

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