Unlock instant, AI-driven research and patent intelligence for your innovation.

Film formation equipment and substrate processing equipment

A technology for a substrate processing device and a film-forming device, which can be applied to gaseous chemical plating, coatings, electrical components, etc., and can solve problems such as reduced film thickness uniformity

Active Publication Date: 2016-03-02
TOKYO ELECTRON LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As a result, there is a problem that it may be difficult to process uniformly in the surface of the wafer and the uniformity of the film thickness may decrease.
The invention of Patent Document 2 also describes a method for improving the uniformity of film thickness, but higher uniformity is required

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Film formation equipment and substrate processing equipment
  • Film formation equipment and substrate processing equipment
  • Film formation equipment and substrate processing equipment

Examples

Experimental program
Comparison scheme
Effect test

no. 1 Embodiment approach

[0046] refer to Figure 1 ~ Figure 3 The film forming apparatus 1 according to the embodiment of the present invention will be described. figure 1 , figure 2 and image 3 These are a longitudinal side view, a schematic cross-sectional perspective view, and a transverse cross-sectional plan view of the film forming apparatus 1 . This film forming apparatus 1 forms a thin film by laminating a reaction product on the surface of a wafer W by the ALD method, and performs plasma modification on the thin film. The film forming apparatus 1 includes a substantially circular flat vacuum vessel 11 and a circular turntable 2 horizontally provided in the vacuum vessel 11 . The surrounding of the vacuum container 11 is an air atmosphere, and the inner space of the vacuum container 11 is formed into a vacuum atmosphere during the film forming process. The vacuum vessel 11 is composed of a top plate 12 and a vessel main body 13 , and the vessel main body 13 constitutes the side walls and...

no. 2 Embodiment approach

[0081] Next, the second embodiment will be described focusing on differences from the first embodiment. Figure 12 It is a perspective view of the plasma generating part 8 of the second embodiment, Figure 13 and Figure 14 is a side view of the plasma generating unit 8 . In this plasma generation unit 8, an L-shaped angle adjustment member 81 in a side view is provided on the insulating member 59 at a position close to the outer peripheral portion of the turntable 2, and the L-shaped vertical portion 82 is fixed to the The vertical plate 53 of the Faraday shield 51 . A notch 84 is formed on the lower side of the L-shaped horizontal portion 83 , and the metal wire of the lowermost layer on the outer peripheral portion side of the coil electrode 45 passes through the notch 84 and is sandwiched between the insulating member 59 and the horizontal portion 83 . between. and, if Figure 13 , Figure 14 As shown, the antenna 44 is configured to be rotatable around the metal wir...

no. 3 Embodiment approach

[0085] The plasma generation unit 9 of the third embodiment adjusts the inclination of the antenna 44 in the vertical direction as in the second embodiment. Figure 15 is a perspective view of the plasma generating unit 9, Figure 16 and Figure 17 is a side view of the plasma generating unit 9 . The antenna 44 is provided with four interval adjustment members 91 and a lifting member 92 each formed in a block shape. Three holes are provided in the space adjusting member 91 and the lifting member 92 at intervals in the vertical direction, and the metal wire constituting the antenna 44 is inserted into the holes and wound to form the coil electrode. 45, it is possible to prevent the metal wires of each layer from contacting each other when changing the angle of the antenna 44. This interval adjusting member 91 can also be used for the antenna 44 of other embodiments.

[0086] Similarly to the second embodiment, the Faraday shield 51 is provided with an angle adjustment membe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
sizeaaaaaaaaaa
heightaaaaaaaaaa
Login to View More

Abstract

The present invention provides a film forming device and a substrate processing device. The apparatus is constituted by including a gas supply part for supplying gas for plasma generation to the surface of the substrate mounting area side of the turntable and an antenna extending from the center part to the outer periphery of the turntable. The portion is provided to face the surface of the turntable on the side of the substrate placement region, and is used to make the gas for plasma generation plasma by inductive coupling. In addition, the distance between the above-mentioned antenna and the part near the central part of the turntable of the above-mentioned substrate mounting area is greater than the separation distance between the part of the above-mentioned substrate mounting area near the outer peripheral part of the turntable. Configured in a way larger than 3mm.

Description

technical field [0001] The present invention relates to a film forming apparatus and a substrate processing apparatus that sequentially supply a plurality of types of processing gases to a substrate to perform film forming processing on the substrate. Background technique [0002] As a method of forming a silicon oxide film (SiO 2 ) and other thin films, the ALD (Atomic Layer Deposition: Atomic Layer Deposition) method in which a plurality of types of processing gases that react with each other are sequentially supplied to the surface of the substrate to laminate the reaction product can be cited. As a film-forming apparatus for performing film-forming processing using this ALD method, for example, as described in Patent Document 1, there is known an apparatus in which a plurality of substrates are arranged in the circumferential direction on a rotary table provided in a vacuum chamber, and For example, by rotating the turntable relative to a plurality of gas supply units a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): C23C16/44C23C16/455C23C16/50C23C16/54H01L21/285
CPCC23C16/45536C23C16/45544C23C16/507H01J37/321H01J37/3211
Inventor 加藤寿小林健菊地宏之三浦繁博
Owner TOKYO ELECTRON LTD