Measuring circuit of single-particle pulse width

Abstract

The invention discloses a measuring circuit of single-particle pulse width. The measuring circuit comprises a single-particle pulse signal generating circuit and at least one stage of a measuring circuit. The single-particle pulse signal generating circuit generates a single-particle pulse signal to be measured. A bistable circuit directly driven by the single-particle pulse signal to be measured forms a first stage of the measuring circuit. From a second stage of the measuring circuit on, each stage of circuit is composed of a pulse attenuator circuit and a bistable circuit. The input ends of the pulse attenuator circuits are connected with the signal input ends of the bistable circuits of former stages, and output ends of the pulse attenuator circuits are connected with the signal input ends of the bistable circuits of identical stage circuit. The output ends of a stage of preset bistable circuit or multiple stages of preset bistable circuits form the output result of the measuring circuit together, and the output result corresponds to the single-particle pulse width. The measuring circuit of the single-particle pulse width can improve the measuring accuracy of the single-particle pulse width, and reduce equipment cost.

Description

Technical field [0001] The invention relates to the technical field of electrical pulse signal measurement in the electronics industry, in particular to a single-event pulse width measurement circuit. Background technique [0002] With the development of technology in aerospace, military and other fields, more and more integrated circuits need to work in a radiation environment. The effects of radiation on integrated circuits are mainly divided into two categories: single event effects and total dose effects. [0003] Among them, the single-event transient effect is the main factor affecting chip performance. When the chip is placed in a radiation environment, surrounding energy particles will be injected into the chip. Due to ionizing radiation, a certain number of electron and hole pairs will be generated on the trajectory of the energy particles; these electron and hole pairs are affected by the chip under the action of the electric field. The upper circuit node absorbs and ch...

AI Technical Summary

Problems solved by technology

If a traditional oscilloscope or logic analyzer is used to measure the pulse width of a single event, the requirements for the operating frequency of the device are very high, the test cost is high and the implementation is very difficult

If the on-chip circuit is used for testing, the existing pulse width measurement method often uses an external input high-frequency signal to sample the pulse signal. The capture accuracy of this measurement method is affected by the frequency and performance of the sampling signal, and it is difficult in actual testing. Provides sampling signals with extremely high frequency and excellent waveform characteristics, so the range of measurable pulse width is small, the measurement accuracy is low, and it is not suitable for measuring the width of single event pulses

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