The present application relates to the field of
vacuum electronics terahertz technology, and specifically discloses a reliability
analysis design method for a terahertz folded
waveguide traveling wave tube, which comprises an
electron gun, a
signal input window, a folded
waveguide high-frequency structure, a
signal output window, a collector, a high-frequency
heat sink and a heat dissipation base, the
electron gun is used for emitting an
electron beam; the folded
waveguide high-frequency structure generates
terahertz radiation by reducing the interaction between the electromagnetic wave
phase velocity and the electron beam; the
signal input window and the signal output window are used for inputting and outputting signals; the collector is used for recycling and dissipating the energy of the electron beam after the interaction between the electron beam and the wave; and the high-frequency
heat sink and the heat dissipation base are used for fixing the
traveling wave tube; the
simulation method provided by the present application performs a systematic reliability analysis on the whole
traveling wave tube, which is different from the analysis of each component, and is helpful to find structural defects and solve problems, provides
simulation analysis guidance for actual
processing and
assembly, improves the success rate of
engineering tube production, reduces production cost and shortens the development cycle.