Mid-infrared photoelectric detector driving circuit, detector assembly and assembly array

Abstract

The invention discloses a mid-infrared photoelectric detector driving circuit, a detector assembly and a detector assembly array. The compensation to the detector along with the drift of the ambient temperature baseline can be realized by adopting a compensation detector, which is identical with the hidden resistance characteristic of a measuring detector, and the driving circuit thereof, the change amplitude of an output baseline can be reduced, and the influence on dynamic measurement range of optical signals can be decreased; the driving circuit can also be used in both single mid-infrared photoelectric detector assembly and the mid-infrared photoelectric detector assembly array, a plurality of ways of measuring detectors can be compensated by adopting one way of compensation detector, thereby meeting the need of simultaneously measuring the detectors, and greatly lowering the production cost and decreasing the power consumption.

Description

technical field [0001] The invention relates to a mid-infrared light detection technology, in particular to a photoconductive mid-infrared detector drive circuit, a detector component and a detector component array. Background technique [0002] Photoconductive photodetectors are often used to measure the power of mid-infrared light. During the measurement, the incident light causes the resistance of the detector to change, and the change rate is linearly related to the incident light power. Therefore, the change of light power can be calculated by measuring the change of resistance. However, in its application, the dark resistance (also called element impedance) of the photoconductive detector itself is also very sensitive to temperature changes, which will affect the accurate measurement of the signal. [0003] figure 1 It is a common mid-infrared detector driving circuit, which consists of an operational amplifier and three fixed resistors R 1 , R 2 , R 3 and measurin...

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to overcome the influence of the excessive output baseline signal amplitude of the mid-infrared detector existing in the existing drive circuit in different temperature range applications on the dynamic range of optical signal measurement, and propose a The mid-infrared photodetector drive circuit, detector components and component arrays, in the measurement application, the output signal baseline does not change drastically due to the change of the working temperature, and can be basically stable near zero, so as to realize the drift of the output signal baseline when the temperature changes in a wide range compensation and improve the accuracy of measurement results

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