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Method for determining parameters of 8mm substrate integrated waveguide circulator

A substrate-integrated waveguide and parameter determination technology, applied in the millimeter wave and microwave fields, can solve the problems of difficult to obtain mathematical analysis relationship of performance indicators, complex structure, etc., and achieve the effect of speeding up the test cycle, improving the qualification rate, and reducing the processing cost.

Active Publication Date: 2013-05-01
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

However, as far as the Substrate Integrated Waveguide Circulator (SIW Circulator for short) is concerned, its structure is relatively complicated-the structure of the device includes substrate integrated waveguide, microstrip line, ferrite
Therefore, it is difficult to obtain the mathematical analytical relationship between the performance index and each parameter

Method used

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  • Method for determining parameters of 8mm substrate integrated waveguide circulator
  • Method for determining parameters of 8mm substrate integrated waveguide circulator
  • Method for determining parameters of 8mm substrate integrated waveguide circulator

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Experimental program
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Embodiment Construction

[0025] The tolerance analysis method step of the present invention is as follows:

[0026] Step 1: A SIW circulator with a size of 8×8 mm2 working in the Ka band was designed. Meet the following indicators

[0027] 1) Center frequency 35.5GHz~36GHz

[0028] 2) Insertion loss -0.3dB or less

[0029] 3) The bandwidth of the return loss of each port below -23dB is greater than 2GHz

[0030] 4) The impedance of the three ports is 50 ohms

[0031] Step 2: Taking the size parameter of the circulator in step 1 as the central value, combined with the uniform design experiment method, making single variable changes to some parameters within a certain range around the central value, and performing simulation in HFSS software.

[0032] Step 3: Take the center frequency, insertion loss, and bandwidth below -23dB as the objective function, and obtain the change of each objective function when a single variable is changed in step 2.

[0033] Step 4: Calculate the standard deviation σ(x...

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Abstract

The invention relates to a method for determining parameters of an 8mm substrate integrated waveguide circulator, which relates to the microwave and millimeter wave technology. The method comprises the following steps of step 1, determining a substrate integrated waveguide (SIW) circulator; step 2, changing partial parameters with a single variable, and conducting the simulation; step 3, obtaining the variation situation of each target function; step 4, calculating a standard deviation sigma(x) of each size parameter within a variation range and a standard deviation sigma (f) of each correspondent target function; step 5, analyzing the sensitivity; and step 6, utilizing a worst-case tolerance analysis method to obtain acceptable deviation of the size according to the normalization sensitivity of the target function. Due to the adoption of the method, the machining cost of the circulator can be reduced.

Description

technical field [0001] The present invention relates to microwave and millimeter wave technologies. Background technique [0002] The use of various algorithms to assist in determining device parameters is widely used in the prior art, for example, Chinese patent CN200810150928.2, authorized announcement number CN101546347B, and the invention name is "Method for determining parameters of rectangular waveguide low-pass filter". [0003] Today, people are working more and more frequently on electronic devices. From low-frequency, high-frequency to microwave and millimeter-wave, and then to the terahertz that is currently being researched in full swing, the size of the device is getting higher and higher. On the one hand, this meets the current requirements for device miniaturization and circuit integration. On the other hand, the small size undoubtedly increases the processing difficulty of the device. Although the microfabrication technology is becoming more and more matur...

Claims

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Application Information

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IPC IPC(8): G06F17/50H01P1/387
Inventor 陈良付强汪晓光邓龙江何璐梁迪飞
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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