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Thin film transistor liquid crystal display device and repairing method thereof

A liquid crystal display device and thin film transistor technology, which is applied to instruments, nonlinear optics, optics, etc., can solve problems such as low repair success rate, and achieve the effects of avoiding short circuit phenomenon, avoiding light leakage, and improving repair success rate.

Active Publication Date: 2013-06-12
BEIHAI HKC OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In view of this, the object of the present invention is to provide a thin film transistor liquid crystal display device and its repair method, to solve the problem of low repair success rate of the existing thin film transistor liquid crystal display device

Method used

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  • Thin film transistor liquid crystal display device and repairing method thereof
  • Thin film transistor liquid crystal display device and repairing method thereof
  • Thin film transistor liquid crystal display device and repairing method thereof

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Experimental program
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Effect test

Embodiment 1

[0040] This embodiment discloses a thin film transistor liquid crystal display device, including:

[0041] Substrate, gate line, common line, gate insulating layer, silicon island, data line, source electrode, drain electrode, passivation layer and pixel electrode, described pixel electrode comprises the light-transmitting region of pixel electrode and the opaque region of pixel electrode In the light area, a repair mark is arranged on the gate line, and the repair mark corresponds to the overlapping part of the drain and the gate.

[0042] Specific settings such as Figure 4 Shown:

[0043] A substrate (not shown in the figure), the substrate is a glass substrate or a substrate of other materials.

[0044] The gate lines G11, G12 and the common line C11 are disposed on the first metal layer, and the first metal layer is disposed on the surface of the substrate.

[0045] Specifically, the common line C11 is U-shaped in each corresponding pixel area, and conducts through the...

Embodiment 2

[0055] The difference between this embodiment and the first embodiment lies in that the repair mark corresponds to the opaque region of the pixel electrode, and a light-shielding structure is included between the gate insulating layer and the passivation layer corresponding to the repair mark.

[0056] Such as Image 6 as shown, Image 6 -a is a top view, the repair mark X1 corresponds to the opaque area of ​​the pixel electrode P11, and the repair mark X1 has a circular repair mark pattern that penetrates the gate line G11, that is, the laser can be used on the substrate side Welding technology welds the gate line G11 and the opaque area of ​​the pixel electrode P11 together at the repair mark. Preferably, on the substrate side, laser welding technology can be used to weld the gate line G11 and the edge of the pixel electrode P11 at the repair mark. positions welded together, the repair mark figure can also be a rectangle or other figures that can play a marking role, and a ...

Embodiment 3

[0062] The difference between this embodiment and the above-mentioned embodiment is that, as Figure 7 As shown, the liquid crystal display device disclosed in this embodiment includes a first repair mark X11 and a second repair mark X12, and a light-shielding structure is included between the gate insulating layer and the passivation layer corresponding to the second repair mark X12.

[0063] The first repair mark X11 is the same as the repair mark X in the first embodiment, and the repair mark X12 is the same as the repair mark X1 in the second embodiment.

[0064] It can be seen that in the process of repairing bright spots of TFT liquid crystal display devices, the position of the repair point can be accurately judged, so as to avoid the short circuit between the gate line G12 and the source S11, improve the success rate of repair, and avoid pixel edge damage. The phenomenon of light leakage occurs, and since the gate insulating layer corresponding to the second repair mar...

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Abstract

The invention discloses a thin film transistor liquid crystal display device and a repairing method thereof. A repairing mark is arranged on a gate line of the device; the repairing mark is corresponding to an overlapped part of a drain and a gate, or corresponding to a non-transmitting area of a pixel electrode; and when the repairing mark is corresponding to the non-transmitting area of the pixel electrode, a shading structure is arranged between a gate isolation layer and a passivation layer corresponding to the repairing mark. During the process of repairing a display device light spot, under the condition that the repairing mark is corresponding to the overlapped part of the drain and the gate, the position of the repairing point can be exactly judged, so that the short circuit phenomenon between the gate line and a source electrode can be avoided, and the repairing success rate can be improved; and under the condition that the repairing mark is corresponding to the non-transmitting area of the pixel electrode, the light leakage phenomenon at the edge of the pixel can be avoided, because the shading structure is arranged between the gate isolation layer and the passivation layer corresponding to the repairing mark, the light leakage phenomenon does not occur at the repairing mark, and the repairing success rate can be improved.

Description

technical field [0001] The invention belongs to the field of liquid crystal display, in particular to a thin film transistor liquid crystal display device and a repair method thereof. Background technique [0002] In the process of making thin film transistor liquid crystal display (TFT-LCD, Thin Film Transistor-Liquid Crystal Display), due to the quality of film formation, the cleanliness of the environment, the design of the device itself and the equipment itself, it is not possible to Avoiding problems such as impurity particles and film shedding, which will lead to problems such as abnormal drive of pixel signals and pixel defects. When these problems appear at any point in the display area, the display quality of the thin film transistor liquid crystal display device will be greatly reduced. The existing solution is generally to make the bright spot defects into dark spots by laser repair after making the liquid crystal cell and powering on the test. [0003] The spec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/1362G02F1/1368G02F1/1335G02F1/13
Inventor 梁艳峰黄贤军姜炜
Owner BEIHAI HKC OPTOELECTRONICS TECH CO LTD
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