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Oversized view field off-axis reflection system used for imaging spectrometer

An imaging spectrometer and telescopic system technology, which is applied in the field of off-axis reflection telescopic system with super large field of view, can solve the problems of small field of view and achieve the effects of light weight, small volume and small stray light coefficient

Inactive Publication Date: 2013-07-10
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the problem that the existing imaging spectrometer has a small field of view and cannot meet the global coverage once a day, the present invention provides a super-large field of view off-axis reflection telescopic system for imaging spectrometers

Method used

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  • Oversized view field off-axis reflection system used for imaging spectrometer
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specific Embodiment approach 1

[0010] Specific implementation mode 1. Combination figure 1 with figure 2 Describe this embodiment, a super-large field of view off-axis reflection telescopic system for imaging spectrometers, the optical system includes a first stray light stop 1, a first mirror 2, a second stray light stop 3, Depolarizer 4, aperture stop 5, second reflector 6, and incident slit 7; the parallel light beam emitted by the target enters the first reflector 2 through the first destray light stop 1, and is reflected by the first Mirror 2 reflects and focuses on the second stray light stop 3, exits from the second stray light stop 3, passes through the depolarizer 4 and the aperture stop 5, and enters the second mirror 6, after the second reflection The mirror 6 is focused and imaged onto the entrance slit 7; the aperture stop 5 is located between the first reflector 2 and the second reflector 6, and is located on the focal plane of the second reflector 6; the depolarizer 4 Located near the aper...

specific Embodiment approach 2

[0013] Specific Embodiment 2. This embodiment is an embodiment of a super large field of view off-axis reflection telescope system for imaging spectrometer described in specific embodiment 1: a super large field of view off-axis reflection telescope for imaging spectrometer The telescopic system is used as a telescopic system for a push-broom atmospheric sounding imaging spectrometer. The orbital height is 705km, the field of view is 115° (x direction, width direction) × 0.81° (y direction, along-track direction), and the corresponding ground is 2600km× 10km. The focal length of the telephoto system is 22mm, and the size of the incident slit is 44mm×0.311mm. The radius of curvature of the first reflector is -53.28mm, the radius of curvature of the second reflector is 304.35mm, and the off-axis angle of the first reflector is α 1 is 4°, the off-axis angle α of the second reflector 2 is -4°, the aperture stop is located between the first reflector and the second reflector, and...

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Abstract

The invention provides an oversized view field off-axis reflection system used for an imaging spectrometer and relates to the technical field of space optics. The oversized view field off-axis reflection system used for the imaging spectrometer solves the problems that an existing spectrometer is not large enough in view field and covering width and is long in return visit period. The oversized view field off-axis reflection system used for the imaging spectrometer comprises a first parasitic light eliminating diaphragm, a first reflector, a second parasitic light eliminating diaphragm, a depolarizer, an aperture diaphragm, a second reflector and an entrance slit. Parallel beams which are emitted by a target penetrate the first reflector through the first parasitic light eliminating diaphragm, are reflected and focused on the second parasitic light eliminating diaphragm through the first reflector, penetrates the second reflector through the depolarizer and the aperture diaphragm after leaving the second parasitic light eliminating diaphragm, and are focused and imaged to the entrance slit through the second reflector. Due to the adoption the optics system, the imaging spectrometer is oversized in view field, small in size, light in weight, free from blocking, small in parasitic light, high in deliver function, and wide in applicative wave band. The oversized view field off-axis reflection system used for the imaging spectrometer are applied in aerospace atmospheric remote sensing field, ocean water color sensing field, territorial resource sensing field and the like.

Description

technical field [0001] The invention relates to the technical field of space optics, in particular to an off-axis reflection telescope system with a super large field of view used for imaging spectrometers in space optics. Background technique [0002] The imaging spectrometer is a new type of space optical remote sensing instrument that can simultaneously acquire the image and spectral data of the target. It is widely used in the fields of ground reconnaissance, atmospheric remote sensing, and ocean remote sensing. The imaging spectrometer optical system consists of a telescopic system and a spectrometer system, which are organically connected through the entrance slit. The function of the telescopic system is to image the target on the incident slit, so the width of the imaging spectrometer is determined by the field of view of the telescopic system. The larger the field of view of the telescope, the larger the width of the imaging spectrometer, and the shorter the return ...

Claims

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Application Information

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IPC IPC(8): G02B17/06G02B23/06G02B27/28G02B13/02G02B13/06G02B13/22
Inventor 薛庆生王淑荣
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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