Ultrasonic thickness measurement device and method for multilayered wave-absorbing coatings

A wave-absorbing coating and ultrasonic testing technology, applied in the direction of using ultrasonic/sonic/infrasonic waves, measuring devices, instruments, etc., to achieve high measurement accuracy, accurate measurement results, and lightweight equipment

Active Publication Date: 2013-08-14
DALIAN UNIV OF TECH
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Problems solved by technology

Compared with the existing thickness measurement method of absorbing coating, this method should overcome the limitation that the traditional ultrasonic thickness measurement method must be able to read the two resonant frequencies in the signal amplitude spectrum / power spectrum to obtain the coating thickness accurately. There is no requirement for the electrical and magnetic properties of the wave-absorbing coating, and it can accurately measure the thickness of the outermost layer of single-layer and multi-layer wave-absorbing coatings

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  • Ultrasonic thickness measurement device and method for multilayered wave-absorbing coatings
  • Ultrasonic thickness measurement device and method for multilayered wave-absorbing coatings
  • Ultrasonic thickness measurement device and method for multilayered wave-absorbing coatings

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Embodiment Construction

[0031] The thickness measurement device and the thickness measurement method for ultrasonic detection of multilayer absorbing coating figure 1 The shown is a portable digital ultrasonic flaw detector with a bandwidth of 0-35MHz, a delay block probe or a partially immersed ultrasonic delay line probe, a coating sound velocity calibration sample and a computer integrated with a thickness measurement algorithm. It can measure the coating thickness of single-layer, double-layer and three-layer absorbing outer coatings including metal and non-metal substrates. The process of the thickness measurement method is as follows:

[0032] For steel-based wave-absorbing coating samples with a coating thickness ranging from 0.3 to 0.7mm, a delay block probe with a nominal frequency of 15MHz is selected, and the measuring device is first connected to the system and the instrument is calibrated.

[0033] (1) Collect the reflected echo signal R (reference signal) of the delay block probe, such as f...

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Abstract

The invention relates to an ultrasonic thickness measurement device and method for multilayered wave-absorbing coatings, and belongs to the technical field of ultrasonic non-destructive testing and evaluation. The device comprises a portable digital ultrasonic flaw detector with a bandwidth ranging from 0 to 35 MHz, a delay block probe or an ultrasonic delay line probe partly immersed in water, a coating sound velocity calibrated sample and a computer integrated with a thickness measuring arithmetic. The device is characterized in that the coating thickness is calculated by selecting delta t or fn according to the characteristic of ultrasonic echo wave; and through the iteration windowing analysis by combining the autocorrelation method with the sound pressure reflection coefficient power spectrum method, the coating thickness measuring is realized by selecting an exact fn. The device and the method have the advantages that the limitations that in the conventional ultrasonic thickness measuring technology, the requirements to frequency bands of a flaw detector and the probe are high; the data interception needs manual intervention, and the device is only suitable for single-layer coating, are overcome; the size of the device is small; the weight is light; and the device is suitable for the on-the-spot thickness measuring of various matrixes and outer layers of multilayered coatings, and has major economic benefits and social benefits.

Description

Technical field [0001] The invention relates to a thickness measuring device and a thickness measuring method for detecting multilayer wave-absorbing coatings by ultrasonic, which belongs to the technical field of ultrasonic nondestructive inspection and evaluation. Background technique [0002] The use of absorbing materials for radar wave stealth is a very economical and effective technical approach, and the thickness of radar absorbing materials and the uniformity of the coating layer directly affect the final stealth effect. In the process of on-site coating construction and quality inspection, the thickness of each layer of absorbing coating is required to meet the qualified standard. Accurate and reliable nondestructive testing method for the thickness of the absorbing coating is an urgent engineering demand in this field. [0003] The current non-destructive testing methods for the thickness of the absorbing coating mainly include the magnetic method, the eddy current metho...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B17/02
Inventor 雷明凯林莉罗忠兵胡志雄马志远李广凯李喜孟
Owner DALIAN UNIV OF TECH
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