Resistance measuring device of solar cell

Abstract

The invention relates to a resistance measuring device of a solar cell, which comprises a device body, and has the characteristics that an insulation base is arranged on the device body, and correspondingly distributed guide devices are arranged at two sides of the insulation base; and each guide device is provided with a probe assembly connected with a constant-voltage constant-current source assembly; and by such a mode, the metal semi-contact resistance between a metal electrode and a silicon material, the thin-layer resistance of an emitter and a metal electrode resistance of the crystalline silicon solar cell can be accurately measured and analyzed at the same time. Meanwhile, the resistance measuring device is provided with a box cover made of an opaque material, the box cover is connected to outside by using a probe assembly contact electrode in a lead mode, thus meeting the operating conditions of a darkroom and facilitating the operation at the same time. In addition, the first-phase preparing work for performing laser cutting on a silicon wafer is removed.

Description

technical field [0001] The invention relates to a measuring device, in particular to a solar battery resistance measuring device. Background technique [0002] In the research and development and production process of crystalline silicon solar cells, various resistances are very important performance parameters, which affect the fill factor and photoelectric conversion efficiency of solar cells. The measurement and analysis of them is conducive to further analysis of the performance of solar cells, thereby improving battery conversion. efficiency. The resistance test mainly includes the test of the gold half-contact resistance between the metal electrode and the silicon material, the emitter sheet resistance and the metal electrode resistance. Ordinary test instruments or test methods can only test one of them alone, and it needs to combine multiple test instruments to measure various types of resistance values. The method is relatively cumbersome and requires multiple inst...

AI Technical Summary

Problems solved by technology

Ordinary test instruments or test methods can only test one of them alone. It needs to be combined with multiple test instruments to obtain various types of resistance values. The method is relatively cumbersome and requires multiple instruments.

Moreover, the current TLM method for testing solar cells requires laser cutting of the solar cell, and then measures the contact resistance between the metal electrode and the silicon material, which increases the equipment requirements for laser cutting; The distance between the electrodes is equal, and the measurement of electrodes with different spacing needs to cross one or more electrodes. The contact between the electrode and the silicon material will cause measurement errors

Images