Scanning electron microscope magnetic resistance measurement sample stage and nano single magnetic transport property measuring instrument

A scanning electron microscope, sample stage technology, applied in the direction of instruments, scanning probe technology, etc., to achieve the effect of monitoring physical properties throughout the process
CN103293340AInactive Publication Date: 2013-09-11LANZHOU UNIVERSITY
6 Cites 5 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
LANZHOU UNIVERSITY
Publication Date
2013-09-11
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention belongs to measuring methods for magnetic nano materials and magnetic-nanostructure device transport properties, particularly relates to a scanning electron microscope magnetic resistance measurement sample stage and a nano single magnetic transport property measuring instrument. The scanning electron microscope magnetic resistance measurement sample stage comprises a base, a rotator, a nut-shaped clamping stage, a rotating shaft and a sample stage, the base is provided a cylindrical outside, screwed grooves are formed on the inner walls of the base, a piezoelectric pile is arranged inside the base, the rotator is arranged on the base and connected with the same through the rotating shaft, the clamping stage is connected with the rotating shaft and the rotator, and the sample stage is arranged above the clamping stage. The biggest innovation of the scanning electron microscope magnetic resistance measurement sample stage is that, for the first time throughout the world, a magnetic field is introduced into a scanning electron microscope, so that real-time, dynamic and visualized magnetic transport property in nano spaces can be measured, and fixed, rapid, visual and whole-process monitoring and petrophysical property measuring can be realized.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention belongs to a method for measuring the transport properties of magnetic nano materials and magnetic nano structure devices, in particular to a scanning electron microscope magnetoresistance measurement sample stage and a nano single magnetic transport property measuring instrument. Background technique

[0002] At the end of the last century, it was expected that nanotechnology would be put into practical application on a large scale within one or two decades. However, ten years later, this wish has not been realized as expected. One fundamental reason is that the research on nanotechnology lacks sufficient and effective , Equipment, tools and detection systems that can precisely manipulate, tailor and assemble individual nanomaterials and measure the precise physical properties of nanometer monomers at the nanoscale spatial scale. For the research of magnetic nanomaterials and magnetic nanostructure devices, especially the measurement of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More