MBIST (Memory Built In Self Test) controller structure system based on IEEE (Institute of Electrical and Electronics Engineers) 1500 standard and compatible with SRAM/ROM (Static Random Access Memory/Read Only Memory)

Abstract

The invention discloses a testing structure and a testing method based on an IEEE (Institute of Electrical and Electronics Engineers) 1500 standard and compatible with an SRAM / ROM (Static Random Access Memory / Read Only Memory) test. A testing structure is combined with a method of embedded type core testing standard IEEE1500 and a BIST; the testing structure supports to carry out the BIST on a plurality of embedded type SRAMs and ROMs with different types. The structure is formed by two parts, including a testing shell package of the embedded type SRAM and the ROM and an MBIST controller. The testing shell package solves the control problems of testing access, testing isolation and testing of the embedded type SRAM and the ROM. The MBIST controller generates testing stimulation data needed by an SRAM test according to a testing algorithm, controls a package shell Wrapper, carries out response analysis and outputs a testing result; an MISR (Multiple Input Shift Register) is used for finishing data compression operation on data in the ROM. With the adoption of the testing structure and the testing method, the faults of the embedded type SRAM and the ROM can be detected, so as to be good for test reuse of the embedded type SRAM and the ROM; the integration efficiency of an SoC (System on Chip) is effectively improved and the consumption of hardware of an MBIST system is also reduced.

Description

Technical field [0001] The invention relates to a SoC chip, in particular to the embedded memory in the SoC chip, and more specifically to the testing of the embedded memory in the SoC chip. Background technique [0002] The test of embedded memory generally adopts the built-in self-test (BIST) method, which can realize the fault detection of embedded memory, but the existing methods can only perform fault detection on the same type of embedded memory, and cannot be used An MBIST (Memory Built-in Self-Test) controller is used to test multiple different types of embedded memories. [0003] Generally, the same SoC chip contains multiple different types of embedded memories. If a corresponding MBIST controller is designed for each type of memory, the hardware consumption of the MBIST system of the entire SoC chip will be very large, which is not conducive to Reducing test costs is also not conducive to the promotion and development of MBIST technology. Summary of the invention [000...

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Problems solved by technology

[0002] The built-in self-test (BIST) method is generally used for testing embedded memories. This method can realize fault detection for embedded memories, but the existing methods can only detect faults for the same type of embedded memories and cannot be used. A MBIST (memory built-in self-test) controller to complete the test of many different kinds of embedded memories

[0003] Generally, the same SoC chip contains multiple different types of embedded memories. If a corresponding MBIST controller is designed for each type of memory, the hardware consumption of the MBIST system of the entire SoC chip will be very large, which is not conducive to Reducing the cost of testing is also not conducive to the promotion and development of MBIST technology

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