A fast test switching device and corresponding tft-lcd array substrate

Abstract

Disclosed is a quick test switching device, which is arranged on a TFT-LCD array substrate and used for switching a signal for testing a display area of the TFT-LCD array substrate, and at least comprises: a first switching TFT, wherein the gate electrode thereof is connected to a control chip and a test block and used for receiving a switching control signal from the test block and a closing control signal from the control chip, the source electrode is connected to a data test line or a gate electrode test line, and the drain electrode thereof is connected to a corresponding data line or gate line of the display area. Further disclosed is a corresponding TFT-LCD array substrate. The present invention is beneficial to the narrowing of the frames of liquid crystal panels, and can improve the yield of the TFT-LCD array substrate.

Description

technical field [0001] The invention relates to thin film transistor liquid crystal display (Thin Film Transistor Liquid Crystal Display, TFT-LCD) technology, in particular to a fast test switching device and a corresponding TFT-LCD array substrate. Background technique [0002] During the production process of TFT-LCD panels, it is necessary to test the internal circuits, find problems and repair them in time. This process is called the panel test process (cell test). At present, the widely used panel test method is to introduce the design of the test short bar (shorting bar) under the gate bonding pad and the source bonding pad. After the panel test is completed, the test The wiring of the stub is cut by laser cutting, but this kind of test circuit is expensive due to the design of the test stub and needs to occupy a large space on the panel, so there is no way to realize the narrow frame design of the panel. For example, in a 46-inch TFT-LCD, the space occupied by the te...

AI Technical Summary

Problems solved by technology

The currently widely used panel test method is to introduce a test short bar (shorting bar) design under the gate bonding pad and source bonding pad. After the panel test is completed, the test The wiring of the stub is cut by laser cutting, but this kind of test circuit is expensive due to the design of the test stub and needs to occupy a large space on the panel, so there is no way to realize the narrow frame design of the panel. For example, in a 46-inch TFT-LCD, the space occupied by the test stub and the wiring required for laser cutting is 630 μm

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