Semi-blind oversampling clock data recovery circuit with high locking range

Abstract

The invention discloses a semi-blind oversampling clock data recovery circuit with a high locking range, which is mainly used for improving the range of application of the semi-blind oversampling clock data recovery circuit and avoiding generating error code during excessive continuous word time data recovery. The semi-blind oversampling clock data recovery circuit comprises a receiver (1) composed of a multi-path parallel oversampling circuit (11) and a frequency detector FD (12), a data recovery and frequency phase control circuit (2) composed of a filtering and shaping circuit (21), an edge detection circuit (22), a data recovery circuit (23), a phase information circuit (24), a byte adjustment circuit (25) and a frequency/phase adjustment circuit (26), and a feedback circuit (3) composed of a multi-phase VCO (Voltage Controlled Oscillator) circuit (31), a LPF (Low Pass Filter) circuit (32) and an DAC (Digital to Analog Converter) circuit (33). Through the adjustment, the frequency of the sampling clock just can sample the input data, the locking is realized, and the clock data recovery is further accomplished.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuit design, in particular to a clock data recovery circuit (CDR) for serial communication. Background technique [0002] As an important part of the receiving end, the clock data recovery circuit (CDR) is responsible for extracting synchronous information from high-speed serial data, and using this synchronous information to sample the serial signal to recover the correct digital signal, and realize serial parallel to the data convert. Generally speaking, when serial data is sent to the transmission medium at the sending end, the characteristics of the data signal are ideal. At the receiving end, the data signal arriving through the transmission medium is superimposed by external noise and interference. When the receiving end extracts data from the serial data, it must select the best sampling decision time to ensure the minimum bit error rate. In view of such a situation, ...

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JournalOfSolid-StateCircuits上于2007年发表的A3.2Gb/sCDRUsingSemi-BlindOversamplingtoAchieveHighJitter Tolerance和A40–44Gb/s3×OversamplingCMOSCDR/1:16DEMUX以及JOURNALOF SELECTEDTOPICSINQUANTUMELECTRONICS上于2010年发表的5/10-Gb/sBurst-Mode ClockandDataRecoveryBasedonSemiblindOversamplingforPONs:Theoreticaland Experimental can se...

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