Automatic energy dispersive X-ray fluorescence analysis test platform

Abstract

The invention discloses an automatic energy dispersive X-ray fluorescence analysis test platform. The automatic energy dispersive X-ray fluorescence analysis test platform comprises a sample chamber, a stepping motor and an electric cylinder. The sample chamber and a seal plate form a closed chamber. The stepping motor is fixed to a tray. The tray is connected to a bracket. The bracket is connected to the electric cylinder. A rotation shaft of the stepping motor passes through the seal plate and enters into the closed chamber. The rotation shaft of the stepping motor is provided with a sample support. The sample chamber is provided with an X-ray pipe, a camera and a detector. The closed chamber is communicated with a vacuum pump. The camera is connected to a computer. The automatic energy dispersive X-ray fluorescence analysis test platform reduces measure errors, reduces detector-caused pollution, improves a light element detection capability and improves detection efficiency.

Description

technical field [0001] The invention belongs to the field of analysis and test equipment, and relates to a fluorescence spectrometer, in particular to an automatic energy dispersion X fluorescence analysis and test platform. Background technique [0002] The energy dispersive X-ray fluorescence spectrometer is configured according to the X-ray fluorescence spectroscopic analysis method. It can analyze the composition content of various elements in solid or powder samples. It has the characteristics of high sensitivity, good precision, stable performance, and fast analysis speed. It is a A small and medium-sized, economical, high-performance energy dispersive X-ray spectrometer. [0003] The energy dispersive X-ray fluorescence spectrometer consists of an excitation source (X-ray tube) and a detection system. The X-ray tube generates incident X-rays (primary X-rays) to excite the sample to be measured. Each element in the excited sample emits secondary X-rays, and the secon...

AI Technical Summary

Problems solved by technology

[0007] 1. In the way of fixing the sample directly above the detector, the detector will often be polluted because the sample dust falls on the detector;

[0008] 2. In the way of pushing samples in parallel, the sample table is often polluted due to the collapse of the sample, which is not easy to clean;

[0009] 3. In the three-dimensional push method, although the sample can reach the designated position by setting the moving distance in the X, Y, and Z directions, the precise control of the moving distance is often not achieved, which makes the distance between the sample and the detector Distance cannot be precisely controlled

In this way, the degree of wear and tear of the instrument

[0010] Second, during the detection process, X-rays are incident from an angle. Since the sample is in a static state, the characteristic X-rays often diverge unevenly, resulting in low detection efficiency.

[0011] Third, for elements with a small atomic number, the characteristic X-ray energy is small, which is easily absorbed by the air, making the detection efficiency of these light elements in the measurement process not high

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