Unlock instant, AI-driven research and patent intelligence for your innovation.

Fully automatic megasonic semiconductor wafer cleaning equipment

A cleaning equipment and megasonic wave technology, which is applied in the field of fully automatic megasonic semiconductor wafer cleaning equipment, can solve problems such as the inability to meet the cleanliness requirements of high-precision wafers, achieve the effect of guaranteeing, improving work efficiency, and meeting cleanliness

Active Publication Date: 2015-12-02
东莞市凯迪微智能装备有限公司
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, with the further understanding and development of aviation technology and space technology, more and more precise circuit boards, wafers and semiconductor components are required. The spray cleaning of general single wafer cleaning equipment can no longer achieve the cleanliness of high precision wafers. requirements, which requires the development of high-end precision cleaning equipment that can meet this requirement on the basis of the original

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fully automatic megasonic semiconductor wafer cleaning equipment
  • Fully automatic megasonic semiconductor wafer cleaning equipment
  • Fully automatic megasonic semiconductor wafer cleaning equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] In order to illustrate the idea and purpose of the present invention, the present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0033] See figure 1 , figure 2 as shown, figure 1 It is a schematic diagram of the shell structure of the automatic megasonic semiconductor wafer cleaning equipment of the present invention; figure 2 It is a schematic diagram of the internal structure of the automatic megasonic semiconductor wafer cleaning equipment of the present invention. The embodiment of the present invention provides a fully automatic megasonic semiconductor wafer cleaning equipment, which is mainly used to realize the cleaning of high-precision semiconductor wafers and meet the cleanliness requirements thereof.

[0034] The cleaning device includes: a casing 10 , a cavity 12 disposed above the casing 10 , and an air filter mechanism 80 installed above the cavity 12 . The casing 10 is the basic fr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a full-automation mega sound wave semiconductor wafer cleaning device. Mega sound waves generated by a mega sound wave generator are used for entering a mega sound wave cleaning mechanism arranged in a cavity. Clean ID water entering from a water inlet end can correspondingly contain ultrasonic wave energy and pollutants of a workpiece which is rotating on a cleaning plate are punched through and gasified. Meanwhile, water enters through a double fluid cleaning mechanism is used for being mixed with entering compressed air to generate atomization deionized water molecules. The atomized deionized water molecules can be fully fill into the whole cavity and small seams of the workpiece so as to achieve the effect of fully cleaning. Compared with the prior art, the manner of combining double fluids, high-frequency mega sound waves and ion wind is used for cleaning a high-precision semiconductor wafer, and meeting the requirement for the cleanliness of the high-precision semiconductor wafer. Meanwhile, after the high-precision semiconductor wafer is cleaned, the high-precision semiconductor wafer is rapidly dried in a centrifuge dripping mode, the working efficiency is effectively improved and the cleaning effect is ensured.

Description

Technical field: [0001] The invention belongs to the technical field of semiconductor cleaning, and in particular relates to a fully automatic megasonic semiconductor wafer cleaning device. Background technique: [0002] Wafer refers to the silicon wafer used in the production of silicon semiconductor integrated circuits. Because of its circular shape, it is called a wafer; it can be processed into various circuit element structures on the silicon wafer, and become an IC with specific electrical functions. product. With the development of the size of integrated circuits on semiconductor wafers to the micron level, the cleaning requirements in the semiconductor wafer manufacturing process are getting higher and higher, especially if the semiconductor wafers are polluted by dust particles and metals during the manufacturing process, It is easy to cause damage to the function of the circuit in the chip, form a short circuit or an open circuit, etc., resulting in the failure of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/67B08B3/12B08B3/02
CPCB08B3/12H01L21/67023
Inventor 高辉武曾志家
Owner 东莞市凯迪微智能装备有限公司