Radiation EMI (electro magnetic interference) testing method based on GTEM (gigahertz transverse electro magnetic) cell

A test method and radiation field technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of low test result accuracy, and achieve the effect of improving test accuracy and simple test method.

Active Publication Date: 2014-01-22
南京炫淼电子科技有限公司
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Problems solved by technology

[0004] The present invention provides a kind of radiated EMI test method based on GTEM cell, this test method is based on total power algorithm, carries out phase complement with Lee algorithm, has overcome phase factor when total power algorithm is used alone and Lee algorithm is used alone Approximate assumptions introduce errors that lead to lower accuracy of test results

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  • Radiation EMI (electro magnetic interference) testing method based on GTEM (gigahertz transverse electro magnetic) cell
  • Radiation EMI (electro magnetic interference) testing method based on GTEM (gigahertz transverse electro magnetic) cell
  • Radiation EMI (electro magnetic interference) testing method based on GTEM (gigahertz transverse electro magnetic) cell

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[0023] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0024] figure 1 is the internal structural parameters of the GTEM cell, where represents the width of the cell, Indicates the core plate height, represents the gap width, Indicates the height of the EUT from the floor.

[0025] figure 2 is the simulated equivalent open-field survey layout, where is the straight-line distance from the EUT to the receiving antenna, is the straight-line distance from the image of the EUT to the receiving antenna, is the horizontal distance from the EUT to the receiving antenna.

[0026] frequency pointf 0 The 10MHz standard DUT (hereinafter referred to as EUT) is placed in the GTEM cell. According to the test requirements of the total power algorithm, the equivalent voltage signal at the output port of the standard DUT is measured when it is placed in the GTEM cell in different direction...

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Abstract

The invention provides a radiation EMI testing method based on a GTEM cell. According to the method, the horizontal radiation field intensity and the vertical radiation field intensity of a standard tested object with a frequency point of f0 in a radio wave dark room are firstly calculated, then, the horizontal polarization equivalent radiation field intensity and the vertical polarization equivalent radiation field intensity of a total power algorithm and a Lee algorithm of the standard tested object in a wide field are calculated respectively, a phase compensation and calibration factor corresponding to the frequency point of f0 is calculated according to a formula, the phase compensation and calibration factor and the horizontal polarization equivalent radiation field intensity and the vertical polarization equivalent radiation field intensity of a total power algorithm and a Lee algorithm of any tested equipment are plugged into the formula, and then, the testing result of any tested equipment in the wide field can be obtained. According to the testing method, on the basis of the total power algorithm, the Lee algorithm is used for phase compensation, so that the problem of lower accuracy of a testing result due to the fact that the phase factor is not considered when the total power algorithm is used alone and errors are caused by approximate hypothesis when the Lee algorithm is used alone is solved.

Description

technical field [0001] The invention relates to radiation EMI testing, in particular to a radiation EMI testing method based on a GTEM cell, and belongs to the technical field of electromagnetic compatibility. Background technique [0002] With the rapid progress of science and technology and the rapid development of economy, various electronic products are widely used in people's production and life. The problem of electromagnetic interference generated when these electronic products work at the same time is becoming more and more serious. The problem of electromagnetic interference will not only affect the normal work of electronic products, but also affect people's health. Therefore, more and more attention has been paid to the research on electromagnetic compatibility testing of electronic products. [0003] Electromagnetic compatibility refers to the ability of a device or system to operate in a certain electromagnetic environment to meet the requirements, and not to g...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 赵阳刘勇颜伟陈旸夏欢张杨宋百通丁锦辉
Owner 南京炫淼电子科技有限公司
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