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Selection method used for low-resolution signal source in high-precision ADC test

A low-resolution, test method technology, applied in the field of low-resolution signal source selection, to achieve the effect of accurate test low-cost test, fast and accurate low-cost test, and reduce test cost

Active Publication Date: 2014-01-22
SOUTHEAST UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method needs to analyze the characteristics of a specific filter, and there is a filtering error
In addition, the above methods all require a high-precision signal source

Method used

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  • Selection method used for low-resolution signal source in high-precision ADC test
  • Selection method used for low-resolution signal source in high-precision ADC test
  • Selection method used for low-resolution signal source in high-precision ADC test

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Experimental program
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Embodiment

[0035] This embodiment describes a method for selecting a low-resolution signal source in a high-precision ADC test. The specific selection process includes the following steps:

[0036] 1) Determine the resolution range of the high-precision ADC to be tested assuming it is 16 to 24 bits, and its structure type. Among them, the structure types mainly include sigma-delta, successive approximation, pipeline and Flash.

[0037] 2) For a given object to be tested, clarify its test purpose and application scenario. For example, in communication applications, we focus on the dynamic parameters of the ADC to be tested. In audio, video, and medical and health applications, the focus of attention is on static characteristic parameters. Therefore, when we need to test non-focused characteristic parameters, we need to consider how to reduce the cost of testing as much as possible, mainly including time cost and equipment cost. The main factors affecting time cost include the number of ...

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Abstract

The invention discloses a selection method used for a low-resolution signal source in a high-precision ADC test. Influence on precision of test results when the number of sampling points is increased or decreased is analyzed towards a signal source with the same resolution, a relation model between the number of sampling points and the test results is established on the basis of the aforementioned influence, and the relation between resolution of the signal source and precision of the test results is also established. Based on the obtained relation model, a designated test object and a test objective can be confirmed, and selection of the optimal signal source is realized when objectives of rapid test, precise test and rapid and precise low-cost test are performed on the high-precision ADC. The test results are ensured, and test cost is reduced simultaneously.

Description

technical field [0001] The invention relates to a method for selecting a low-resolution signal source used in high-precision ADC testing. Background technique [0002] With the continuous development of SoC technology, ADC applications have penetrated into various fields, such as medical equipment, satellite communications, wireless communications, control systems, and audio and video. The current existing test software and chip test technology make the application of ADC is developing in two directions of high speed and high precision. However, the lack of accurate testing methods for testing high-resolution ADC performance parameters and the inability to provide ultra-high-resolution signal sources have brought great challenges to ADC applications. In this context, how to realize fast and accurate testing of high-speed and high-precision ADCs to ensure its reliable application becomes very important. [0003] In the field of mixed signal testing, the main test content of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/3167
Inventor 黄成李佑辉
Owner SOUTHEAST UNIV