Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

A Spectral Restoration Method of Interferogram Data Based on Wavelet Analysis

A wavelet analysis and spectral restoration technology, which is applied in the field of spectral restoration of interference data based on wavelet analysis, and can solve problems such as truncation error, unsatisfactory visual effect of interference data fitting, and inversion of spectral data error.

Active Publication Date: 2016-08-17
BEIHANG UNIV
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, interferometry based on polynomial fitting Figure II The sub-sampling method needs to truncate the interferogram and fit it in segments, which introduces a truncation error, and the visual effect of the interference data fitting is not ideal; there are also certain errors in the inversion spectral data

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Spectral Restoration Method of Interferogram Data Based on Wavelet Analysis
  • A Spectral Restoration Method of Interferogram Data Based on Wavelet Analysis
  • A Spectral Restoration Method of Interferogram Data Based on Wavelet Analysis

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0067] The present invention will be further described below in conjunction with the accompanying drawings.

[0068] The present invention is based on wavelet analysis interferogram data spectral restoration method, such as figure 1 As shown, it is realized through the following steps:

[0069] Step 1: Extract the gray value of the same target point from the data captured by the interferometric spectrometer to obtain non-uniformly sampled interferogram data;

[0070] Step 2: Based on wavelet analysis, fitting non-uniformly sampled interferogram data;

[0071] like figure 2 As shown, the non-uniformly sampled interferogram data is brought into the fitting formula based on wavelet analysis, and the fitting function of the interferogram data is obtained, specifically:

[0072] Let the non-uniformly sampled interferogram data set be:

[0073] f s =[f(t 0 )f(t 1 )f(t 2 )...f(t i )...f(t P-1 )] T (1)

[0074] Among them, P is the set f s The number of non-uniform sam...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a wavelet analysis-based interferogram data spectral restoration method, which uses the wavelet analysis-based fitting interpolation method to reconstruct non-uniform sampling interferograms and perform spectrum inversion. First use the fitting method based on wavelet analysis to fit the non-uniform sampling interference data to obtain the fitted interference data curve, and then perform uniform interpolation sampling to obtain uniform sampling interference data. For the uniformly sampled interference data, according to the theory of interference spectroscopy, fast Fourier transform (FFT) is performed to obtain the restored spectrogram. According to the simulation experiment results, it can be seen that this method is better adapted to the characteristics that the interference data changes sharply at the zero optical path difference and changes slowly at the larger optical path difference, and better fits the interference data curve. After uniform sampling, FFT is performed to obtain the spectral inversion map. The advantages of the present invention are: the interferogram data can be fitted more precisely, the characteristics of the interferogram data can be better reflected, and the fitting error is lower.

Description

technical field [0001] The invention belongs to the field of data processing of interference imaging spectrometers, in particular to a wavelet analysis-based method for restoring the spectrum of interference data. Background technique [0002] Due to the advantages of multi-channel, higher luminous flux, better spectral and spatial resolution compared with dispersion-type and grating-type imaging spectrometers, interferometric imaging spectrometers have gradually attracted the attention of various countries and developed maturely in the past ten years. However, the detection data of the interferometric imaging spectrometer is not directly usable target spectral data, but intermediate data—interferogram data. Therefore, data processing is required to invert the target spectrogram. [0003] According to the theory of interference spectroscopy, there is a Fourier transform relationship between the interference data obtained by the interferometric spectrometer and the target sp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00G01J3/45
Inventor 袁艳丁晓铭苏丽娟黄锋振
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com