Method for automatically recognizing element spectral line in LIBS component analysis

Abstract

The invention relates to a method for automatically recognizing an element spectral line in the LIBS component analysis and belongs to the technical field of material component analysis. On the basis of the inherent characteristics of the element spectral line in an automatic recognition stage, despite of the problem that a rule is difficult to make and the known atomic spectrum database is used as a wavelength reference criterion, element spectral line recognition limit parameters are defined, the recognition rule is made and a recognition algorithm is set up with the measurement range and precision of the wavelength and the strength of spectral data as limit conditions. All element spectral data are recognized from the actually-measured spectral data and a complete data base is provided for sequential element component analysis as much as possibly. An NIST atomic spectrum database serves as a wavelength reference criterion, 5310 LIBS spectral lines of fourteen elements in a monoblock low-alloy steel guide sample N-LA17GBW01211 are automatically recognized in seven minutes and element spectral lines conforming to the rule are obtained. The method for automatically recognizing the element spectral line in the LIBS component analysis has the advantages of being high in recognition adaptability and recognition speed and accurate and complete in result.

Description

technical field [0001] The invention belongs to the technical field of material composition analysis, and in particular relates to an automatic identification method of element spectral lines in LIBS composition analysis, which is used to automatically identify element spectral lines from LIBS spectral data actually measured for samples, for subsequent element content analysis. Analysis provides as complete a data base as possible. technical background [0002] LIBS alloy composition analysis technology is an important aspect of material analysis, which has attracted extensive attention from researchers (Wang Haizhou, Frontiers of Metallurgical Analysis [M], Beijing: Science Press, 2004, 255-289). The basic idea of ​​this technology is to excite a sample or a group of samples by laser to generate a plasma spectrum, then use a spectrometer to directly collect the emission line signal generated on the surface of the sample, and finally analyze and process the signal to obtain ...

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Problems solved by technology

[0012] Judging from the existing literature on automatic identification of spectral lines, on the one hand, the problems of self-absorption spectral lines and interference between spectral lines (i.e., matrix effect) that it focuses on are problems that require more manual processing and are difficult to formulate rules. , if it is not handled properly, it will lose a lot of useful spectral data or cause spectral data errors

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