A kind of optical network unit automatic testing method

Abstract

The invention discloses an automatic test method for an optical network unit, comprising: 1. Logging in an optical line terminal; 2. Judging whether the optical line terminal is successfully logged in; 3. Registering the optical network unit; 4. Judging whether the registration status of the optical network unit is correct; 5. 1. Business configuration of the optical network unit; 6. Judging whether the business configuration of the optical network unit is correct; 7. Configuring the data network test instrument; 8. Judging whether the configuration of the data network test instrument is correct; 9. Outputting the test result; 10. Ending the test. The present invention can improve test efficiency, shorten test cycle, and reduce test cost in the research and development stage; it can also assist manufacturers to greatly increase their productivity, and the solution enables engineers of different levels to participate in the test automation process, improving the test engineer's productivity. Value, reduced overhead costs, better use of existing resources, and reduced time-to-market.

Description

technical field [0001] The invention relates to a test technology for a passive optical fiber network, in particular to an automatic test method for an optical network unit. Background technique [0002] The passive optical network (PON) system structure is mainly composed of the optical line terminal (OLT, Optical LineTerminal) of the central office, the optical distribution network (ODN, Optical Distribution Network) including passive optical devices, and the optical network unit / optical network terminal of the user end (ONU / ONT Optical Network Unit / Optical Network Terminal). Compared with active optical access technology, PON eliminates the active equipment between the central office and the user end, which makes maintenance simple, high reliability, low cost, and can save fiber resources, making PON technology the future optical fiber The main solution for to-the-home (FTTH). With the gradual reduction of PON cost and the gradual expansion of application scale, the t...

AI Technical Summary

Problems solved by technology

[0005] 1. Device and interoperability testing requirements are becoming increasingly complex

[0006] 2. The labor and skills required to test each version are increasing, but staffing is not increasing

[0007] 3. The development speed of testing tools is far behind the speed of tools used in designing new products

(According to incomplete statistics, 80% of the tests still need to be executed manually

Images