Test circuit structure and test method of Netcom product

Abstract

The invention discloses a test circuit structure and a test method of a Netcom product, and provides a non signaling test method and structure; compared with a conventional signaling test method, the non signaling test method omits a protocol stack; no radio frequency channel is needed, a computer interface or a network interface are directly used to connect with a control end, thereby effectively handling test errors, having higher speed device control, fast configuring device and test, and reducing the time needed for changing device configuration; the measuring method can also be prepared before device configuration, no connecting signal is needed, so test time can be short, and tester cost can be lowered.

Description

technical field [0001] The invention relates to a test circuit structure and a test method of a Netcom product, in particular to a non-signaling (Non Signaling) test method and structure. Background technique [0002] In today's era of rapid technological development, Netcom products are the latest favorites. All wired and wireless Netcom products have flooded our lives and are inseparable from modern technology. All Netcom products are guaranteed to be delivered on time. All are good products. After the product is manufactured, it must go through rigorous and tedious tests to ensure that the product can work normally before it can be packaged and shipped. [0003] LTE wireless communication technology, short for Long Term Evolution technology, is a new generation of mobile wireless broadband technology that is attracting attention in the wireless data communication market. LTE allows telecommunications service providers to provide wireless broadband access application serv...

AI Technical Summary

Problems solved by technology

[0004] At present, many countries around the world have provided LTE networks for operation or are in the process of construction and testing. The related infrastructure and device design are facing a large number of testing requirements, especially for LTE and LTE-Advanced. In response to the application of the physical layer, there are often relatively difficult choices when selecting test equipment, because the biggest feature of LTE is to greatly improve the overall transmission efficiency of wireless data communication, and the price paid is to make LTE transmission technology more complicated

Especially in terms of product verification, testing the detection limit of current test equipment, coupled with MIMO (multiple-input and multiple-output) RF multi-antenna application technology adopted to improve transmission performance, although this multi-antenna solution is helpful Improve the overall transmission bandwidth, but its design form will also make the test program extremely complicated

[0005] see figure 1 As shown, it is a functional block diagram of the test circuit structure of the existing Netcom product. The existing wireless Netcom product must pass the Signaling Test (Signaling Test) during the test, and one end of the test is a first computer 11 through a The first area network 12 is connected to a signaling tester (Signaling Tester) 13, and the signaling tester 13 is connected to a first antenna 131; the other end of the test is a second computer 17 connected to a Netcom product through a second area network 16 15. The Netcom product 15 is provided with a communication module 151, and the Netcom product 15 is connected to a second antenna 152. The first antenna 131, the second antenna 152 and the Netcom product are all shielded by a shielding box 14, To prevent external signals from affecting the test results, the first antenna 131 and the second antenna 152 are tested through a radio frequency channel (RF Channel) to measure the transmission throughput between the first and second antennas (131, 152) Throughput, it takes a long time to change the device configuration in this way, and it is necessary to wait for the connection signal between the test instrument and the product under test to be tested before testing, which takes a long time to test and the cost of the test instrument is high , so there is still a lot of room for improvement

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