High-precision three-dimensional shape measurement method for jump object

A three-dimensional surface, high-precision technology, used in measuring devices, optical devices, instruments, etc., can solve problems such as resolution reduction

Inactive Publication Date: 2014-07-23
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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AI Technical Summary

Problems solved by technology

The wavelet transform has been greatly improved, and it has great advantages in analyzing the local characteristics of the signal, but it still has certain limitations when denoising complex surface images such as objects with abrupt changes, such as the movement transformation that causes the abrupt change position, resulting in reduced resolution

Method used

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  • High-precision three-dimensional shape measurement method for jump object
  • High-precision three-dimensional shape measurement method for jump object
  • High-precision three-dimensional shape measurement method for jump object

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Embodiment 1

[0057] A method for high-precision three-dimensional surface shape measurement of a jumping object is characterized in that it includes the following steps:

[0058] A. Set up the experimental measurement system: the system mainly includes a digital camera, projector, object to be measured, computer and bracket. Adjust the system so that the digital camera can capture the fringe pattern on the surface of the jumping object to be measured, and at the same time ensure that the line connecting the optical center of the projector and the optical center of the camera is perpendicular to the projection optical axis.

[0059] B. The computer controls the projector to generate and project a standard sinusoidal fringe pattern, and the digital camera shoots the deformed fringes reflected by the surface of the transition object. The light intensity of the deformed fringes can be expressed as:

[0060] I(x,y)=A(x,y)+B(x,y)cos[2πf 0 (x,y)x+φ(x,y)] where I(x,y) represents the light intensi...

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Abstract

The invention provides a high-precision three-dimensional shape measurement method for a jump object. The method is characterized in that the fringe projection profilometry, in combination with curvelet transform, is applied to three-dimensional shape measurement of the jump object. The fringe profilometry based on structured light projection is a high-precision, quick, noncoherent optical full-field object three-dimensional shape measurement technique, and experimental devices adopted are simple, which mainly include a computer, a projector and a digital camera. The projector is used for projecting a plurality of sets of sine fringe patterns different in frequency to the jump object to be tested; the digital camera is used for recording deformed fringe patterns and transmitting the deformed fringe patterns to the computer, and then the deformed fringe patterns are denoised by virtue of curvelet transform and the phase distribution of the deformed fringes is demodulated in combination with a phase shifting method, and unwrapped phase distribution is obtained by using a phase unwrapping method. At last, three-dimensional data of the jump object is obtained according to a phase-height relation. The high-precision three-dimensional shape measurement method has the major gain that a high-precision fast full-field measurement technique for the three-dimensional shape measurement of the jump object.

Description

technical field [0001] The invention relates to the technical field of using a three-dimensional measurement method based on fringe projection profilometry combined with a curvelet transform image denoising method for three-dimensional surface shape measurement of transition objects. Background technique [0002] With the rapid development of precision machining, automobile manufacturing, precision optical processing, semiconductor industry, precision instrument manufacturing, mold design, reverse engineering and other fields, people are increasingly eager to accurately measure workpieces with sudden changes in surface shape. Two-dimensional data measurement equipment can no longer meet the increasingly modernized and automated production requirements, and three-dimensional measurement technology has emerged as the times require. [0003] At present, there are mainly contact three-coordinate measuring instruments, optical scanning, interferometers, etc. for measuring the sur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 岳慧敏赵必玉吴雨祥张博刘永
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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