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Dielectric constant measuring device

A dielectric constant and measuring device technology, which is applied in the field of devices for measuring dielectric constant by using microwave radiation, to achieve the effects of improving measurement accuracy and sensitivity, reducing measurement errors, and low cost

Active Publication Date: 2017-05-10
SICHUAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to propose a device for non-contact measurement of dielectric constant for the measurement of material dielectric constant, especially the problem of high temperature state material dielectric constant measurement.

Method used

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  • Dielectric constant measuring device
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  • Dielectric constant measuring device

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0028] In this example, the dielectric constant measuring device, such as figure 1 and figure 2 As mentioned above, it includes a test chamber 1 and a vector network analyzer (not shown in the figure), and the vector network analyzer can calculate the dielectric constant of the measured medium according to the detected S parameters. The test chamber 1 in this example is a closed metal cavity with a symmetrical structure. The upper part 11 of the metal cavity is a truncated cone for installing the probe 30, and the lower part 12 is a cylinder for containing the measured medium. The truncated cone 11 and the cylinder 12 are butted to form a closed metal cavity, and the symmetry axes of the truncated cone 11 and the cylinder 12 coincide. A probe 30 with a coaxial structure is installed on the top of the truncated cone 11. The probe 30 is an inner conductor with a coaxial structure. The probe 30 is installed on the symmetrical axis of the truncated cone 11 and the metal cylinder...

Embodiment 2

[0030] In this example, the dielectric constant measuring device, the structure of the test chamber 1 is as follows image 3 As shown in the figure, a closed metal cavity is formed by connecting the square pyramid and the square prism of metal materials, the probe 30 is installed on the top of the square pyramid, and coincides with the symmetry axis of the test chamber 1, the bottom of the square pyramid is docked with the square prism, and is The measuring medium is placed in a square prism. The test cavity with this structure has the characteristics of simple structure and convenient processing, and is easy to match with the shape and size of the container containing the measured medium, thereby improving the measurement accuracy. Refer to the description of Embodiment 1 for other structures of this example

Embodiment 3

[0032] like Figure 4 As shown, in the dielectric constant measuring device of this example, the test chamber 1 is composed of a metal hexagonal pyramid and a hexagonal prism butted. For other structures of this example, refer to the description of Embodiment 1.

[0033] The test cavity formed by the butt joint of the above-mentioned frustum and the cylinder has taken into account the convergence performance and the measurement accuracy requirements, and is the preferred shape and structure of the test cavity in the present invention.

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Abstract

The invention relates to a microwave measurement technique and discloses a dielectric constant measurement device. The device comprises a measurement cavity and a measurement instrument, wherein the measurement cavity is a sealed metal cavity of an axially-symmetric structure, the metal cavity is formed by an upper portion and a lower portion in a butt joint mode, the upper portion of the metal cavity is a frustum used for installation of a probe, the lower portion of the metal cavity is a column body or a frustum used for holding measured dielectric, symmetric axes of the upper portion and the lower portion are overlapped, the probe is installed at the top end of the upper portion and is arranged on the symmetric axis of the metal cavity, the probe stretches into the metal cavity, the probe is of a coaxial line structure, the probe is an inner conductor of a coaxial line structure, an outer conductor of the coaxial line structure is connected with the metal cavity, the probe is connected with the measurement instrument through a transmission line to be used for transmitting microwave test signals, the measurement instrument is a vector network analysis meter, and the dielectric constant of the measured dielectric is calculated through an S parameter. According to the device, a non-contact measurement method is adopted, and accordingly measurement errors caused by high temperature can be effectively eliminated.

Description

technical field [0001] The invention relates to microwave measurement technology, in particular to a device for measuring dielectric constant by using microwave radiation. Background technique [0002] With the development of microwave technology, microwave has been widely used in chemistry, metallurgy, medicine and other disciplines. Complex permittivity, as an important macroscopic parameter describing materials in the electromagnetic field, determines and affects the interaction between microwaves and materials. Therefore, under the challenge of new forms of cross-disciplines, the measurement of complex permittivity of matter also proposes a higher Require. The complex permittivity measurement methods of room temperature materials are relatively common, mainly including the transmission line method and the resonance method. However, there is still little research on the complex permittivity measurement of high temperature materials, which has brought a great bottleneck t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
Inventor 黄卡玛杨阳陈倩陈星刘长军郭庆功闫丽萍赵翔杨晓庆
Owner SICHUAN UNIV