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SIMS measuring method for oxygen isotopes in semiconductor or conductor nuclear materials

A technology of oxygen isotopes and measurement methods, applied in the field of nuclear materials, can solve the problems of complex chemical processing and measurement processes, large sample consumption, etc.

Inactive Publication Date: 2014-08-13
CHINA INSTITUTE OF ATOMIC ENERGY
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Problems solved by technology

[0003] At present, the measurement methods of oxygen isotope ratio in uranium oxide are mainly gas mass spectrometry, TIMS method and SIMS method. Among them, gas mass spectrometry is a conventional and classic oxygen isotope measurement method, but the amount of sample used in the measurement of oxygen isotope by gas mass spectrometry is large and expensive. Technical flaws that require complex chemical handling and measurement processes

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  • SIMS measuring method for oxygen isotopes in semiconductor or conductor nuclear materials
  • SIMS measuring method for oxygen isotopes in semiconductor or conductor nuclear materials
  • SIMS measuring method for oxygen isotopes in semiconductor or conductor nuclear materials

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[0044] The above and other technical features and advantages of the present invention will be described in more detail below in conjunction with the accompanying drawings.

[0045] The present invention proposes a method for quickly and accurately measuring oxygen isotopes in uranium oxides from sample processing, sample preparation, optical path adjustment, measurement condition optimization, data collection parameter setting to final result calculation.

[0046] see figure 1Shown, it is the flow chart of the SIMS measuring method of oxygen isotope in the nuclear material in the present invention, and the required sample of the present invention is the metal uranium of depth oxidation, adopts SIMS mass spectrometer to measure, and this specific process is:

[0047] Step a1, sample processing: flatten the surface of the metal uranium sample to ensure a smooth surface, and store it in a desiccator filled with Ar until use.

[0048] Step a2, preparation for cleaning; before sam...

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Abstract

The invention relates to an SIMS measuring method for oxygen isotopes in semiconductor or conductor nuclear materials. The method comprises the following steps: step a, treating a sample, preparing a measuring sample, carrying out sample filling, cleaning experimental equipment, setting measurement parameters and debugging an SIMS mass spectrometer; step b, loading the sample, measuring the sample and respectively recording the counting rates of 18O and 16O; step c, calculating the ratio of 18O to 16O according measuring results obtained in the step a12; step d, carrying out correction and uncertainty calculation on a measured value; and step e, finishing measurement. The SIMS measuring method for oxygen isotopes in deeply oxidized metallic uranium is established through research on optimization of solution and measurement conditions of oxygen in the environment, etc. The method has the characteristics of simple sample preparation, accurate measurement, high measurement precision, a fast measurement speed, etc.

Description

technical field [0001] The invention relates to the field of nuclear materials, in particular to a SIMS measurement method for oxygen isotopes in semiconductor or conductor nuclear materials. Background technique [0002] In the existing technology, the nuclear forensic analysis starts from the interception of nuclear materials on the spot, analyzes the main components and other characteristic attributes of the samples through the techniques and methods confirmed by nuclear forensics, and compares them with the information in the database to trace suspicious The source of the sample; characteristic attributes, generally including the type of radioactivity, radioactivity, main components, isotope abundance, type and content of impurities, macroscopic size, microscopic structure, etc. Sometimes the source cannot be accurately traced through commonly used characteristic attributes, and more characteristic attributes need to be analyzed. Oxygen is a main characteristic element u...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/62
Inventor 王同兴张生栋赵永刚张燕沈彦姜小燕鹿捷
Owner CHINA INSTITUTE OF ATOMIC ENERGY
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