A Flexible Embedded DUT Simulator

Abstract

The invention discloses a flexible embedded type tested device simulator, and particularly provides a Virtual Device Communication Protocol (VDCP) beneficial to flexible design of the measurement and control field. The embedded tested simulator is composed of an embedded main control unit, analog quantity and digital quantity input units, analog quantity and digital quantity output units, a measurement and control bus unit and a display unit. According to the embedded tested device simulator, an excitation receiving module of a tested device is simulated through the input units, a response output module of the tested device is simulated through the output units, the communication mode based on a TCP / IP network between a measurement and control host and an embedded type sub device is standardized through the VDCP, the problem that in the measurement and control field, research of a measurement and control system depends on an electronic tested device too much is solved, the lead time of the measurement and control device is greatly shortened, the development cost of the measurement and control device is greatly reduced, and expandability and reusability of the measurement and control system are also improved.

Description

technical field [0001] The invention relates to the technical field of electronic equipment measurement and control, and proposes a flexible embedded device simulator under test, in particular a virtual device communication protocol (VDCP) on it. Background technique [0002] In the research and development process of the measurement and control system, it is necessary to inject various forms of excitation signals into the object under test and read the excitation response of the object under test to verify whether the test system can accurately generate and send excitation signals, and whether it can receive and analyze response signals . The existing method is to make a real device under test, inject an excitation signal into it, and collect its feedback signal, so as to judge whether the function of the measurement and control system is correct. A disadvantage of this method is that the research and development investment is large, the development cycle is prolonged, and...

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Problems solved by technology

[0003] In view of the above defects in the prior art, the present invention provides an embedded device under test simulator, which receives control commands from the measurement and control host through the VDCP protocol interface based on the TCP / IP network, and completes various functions of simulating the real device under test. It solves the problem of excessive dependence on the tested equipment with specific hardware in the development process of the general measurement and control system, and improves the scalability and reusability of the equipment

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