Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Particle field measurement device and measurement method based on digital micromirror plane structured light illumination

A technology of planar structured light and particle field, which is applied in the direction of analyzing materials and instruments, can solve the problems of system phase shift instability and cumbersome calibration, and achieve avoiding the optical path debugging process, improving phase shifting accuracy, and high-speed and stable particle field measurement Effect

Inactive Publication Date: 2016-05-04
HARBIN ENG UNIV
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, limited by the phase shifting speed of the rotary phase shifter, this method can only be used for low-speed measurement, and because of the non-linearity of the rotation of the rotary phase shifter, it is easy to cause the instability of the phase shift of the system, requiring very cumbersome calibration

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Particle field measurement device and measurement method based on digital micromirror plane structured light illumination
  • Particle field measurement device and measurement method based on digital micromirror plane structured light illumination
  • Particle field measurement device and measurement method based on digital micromirror plane structured light illumination

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] The implementation examples of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0016] The device of the present invention comprises: a light source 1, a collimating beam expander system 2, a total internal reflection prism 3, a DMD4, a first cylindrical lens 5, a filter 6, a second cylindrical lens 7, a particle field 8, an image sensor 9, Computer 10 and synchronous controller 11, wherein the light source 1 is a laser with a wavelength of 532nm, the focal length of the first cylindrical lens 5 is 50mm, the focal length of the second cylindrical lens 7 is 500mm, and the digital one-dimensional periodic grating generated by DMD4 is periodic It is a binary one-dimensional periodic grating of 10 μm; DMD4 is located on the front focal plane of the first cylindrical lens 5, the total internal reflection prism 3 is located between DMD4 and the first cylindrical lens 5, and the filter 6 is located on the first cylindrical...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a particle playground measuring device and a measuring method based on digital micro-mirror plane structured light illumination. The particle playground measuring device is characterized in that parallel light after collimation and beam expanding is reflected by a digital one-dimensional periodic optical grating generated by a DMD (digital mirror device) and forms plane structured light to illuminate a particle playground by sequentially passing through a first cylindrical lens, a filter and a second cylindrical lens, and finally the light is scattered by the particle playground and collected by an image sensor to form an imaging pattern; the DMD and the image sensor are synchronously triggered and controlled by adopting a computer to control a synchronous controller, the digital one-dimensional periodical optical grating is controlled by the DMD to generate the phase shift of 0, 2pi / 3 and 4pi / 3, three patterns with the phase shift of 0, 2pi / 3 and 4pi / 3 are sequentially collected through the image sensor, the collected interference pattern is processed by the computer, and the phase distribution of a to-be-detected object can be acquired. The method and the device have the characteristics of high response speed, stability in phase shift, convenience in use and the like.

Description

technical field [0001] The invention relates to a particle field measurement device, and the invention also relates to a particle field measurement method. Background technique [0002] The laser imaging measurement method is widely used in fuel spray, drug spray, Pesticide spray and other particle field scattering measurement. According to the spatial layout of the light source and detector, laser imaging measurement methods can be divided into forward, backward or side scatter measurement, and the most popular side scatter measurement method is planar laser imaging. After more than 30 years of development, the most common planar laser imaging technologies include particle image velocimetry (PIV, Particle Image Velocimetry), particle tracking velocimetry (PTV, Particle Tracking Velocimetry) and planar laser-induced fluorescence (PLIF, PlanarLaserInduceFluorescence), etc., although these technologies Different scattering characteristics and instrument methods of light are ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N15/00
Inventor 单明广钟志董全杨晓涛马修真刘友
Owner HARBIN ENG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com