Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System for acquiring trap parameters of solid dielectric material

A technology of solid dielectric and trap parameters, which is used in the measurement of electrical variables, resistance/reactance/impedance, instruments, etc., can solve the problems of difficult to achieve solid dielectric material preheating and affect the experimental effect, and achieve sufficient charge injection and temperature distribution. Uniform, easy-to-use results

Inactive Publication Date: 2014-12-10
STATE GRID CORP OF CHINA +2
View PDF11 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing test system has no heating conditions, and it is difficult to realize the preheating of solid dielectric materials, which seriously affects the experimental results

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System for acquiring trap parameters of solid dielectric material
  • System for acquiring trap parameters of solid dielectric material
  • System for acquiring trap parameters of solid dielectric material

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] Such as Figure 1 to Figure 5 As shown, the solid dielectric material trap parameter acquisition system of the present invention includes a constant temperature box 11 and a three-electrode corona charging system, a surface potential measurement system, a rotating support system, and a temperature control system arranged in the constant temperature box 11. The three-electrode corona charging system is used to inject charge into the sample 3 to be tested, the surface potential measurement system is used to test the surface potential attenuation of the sample 3 in a non-contact manner, and the rotating support system is used to realize the charge of the sample 3 under test. Quickly switch between injection mode and surface potential attenuation measurement to accurately measure the instantaneous potential information after charging is completed; the temperature control system is used to adjust the temperature of the experimental environment to obtain sufficient charge injec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Lengthaaaaaaaaaa
Lengthaaaaaaaaaa
Lengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses a system for acquiring trap parameters of solid dielectric material. The system comprises a constant temperature box, a three-electrode corona charging system, a surface potential measurement system, a rotary support system and a temperature control system; the three-electrode corona charging system, the surface potential measurement system, the rotary support system and the temperature control system are arranged within the constant temperature box. The three-electrode corona charging system comprises a plurality of needle electrodes and a meal disc electrode; the needle electrodes are coaxially arranged from top to bottom; the metal disc electrode is grounded. The surface potential measurement system comprises a capacitive static probe disposed on an adjustable insulating holder. The rotary support system comprises an insulating support; a metal turnplate and a metal heating box are arranged on the upper surface of an aluminum plate. The temperature control system comprises a first heater and a second heater. The system is applicable to the acquisition of parameters, such as trap level and trap density, of the solid dielectric material and has the advantages of wide range of application, high measurement precision and simplicity and convenience in operation, and an effective analysis method is provided for the research on surface electrification of the solid dielectric material, surface flashover and the like.

Description

Technical field [0001] The invention relates to a testing device for the dielectric properties of insulating materials, in particular to a trap parameter acquisition system for solid dielectric materials. Background technique [0002] At present, polymer insulating materials and oil-immersed insulation have been widely used in the field of electrical insulation due to their good dielectric properties. However, with the improvement of the voltage level of the power system and the development of DC transmission technology, the space charge effect of polymer insulation has become more and more prominent, which causes the internal electric field distortion of the polymer material, triggers partial discharge and the development of electrical tree branches, and causes material aging and The problem of insulation failure, how to suppress and eliminate the space charge in insulation has become a research hotspot in the field of electrical insulation at home and abroad. [0003] At present...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R27/26
Inventor 张伟政李智敏赵林穆海宝李元申文伟张冠军季国剑
Owner STATE GRID CORP OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products