System for acquiring trap parameters of solid dielectric material
A technology of solid dielectric and trap parameters, which is used in the measurement of electrical variables, resistance/reactance/impedance, instruments, etc., can solve the problems of difficult to achieve solid dielectric material preheating and affect the experimental effect, and achieve sufficient charge injection and temperature distribution. Uniform, easy-to-use results
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[0032] Such as Figure 1 to Figure 5 As shown, the solid dielectric material trap parameter acquisition system of the present invention includes a constant temperature box 11 and a three-electrode corona charging system, a surface potential measurement system, a rotating support system, and a temperature control system arranged in the constant temperature box 11. The three-electrode corona charging system is used to inject charge into the sample 3 to be tested, the surface potential measurement system is used to test the surface potential attenuation of the sample 3 in a non-contact manner, and the rotating support system is used to realize the charge of the sample 3 under test. Quickly switch between injection mode and surface potential attenuation measurement to accurately measure the instantaneous potential information after charging is completed; the temperature control system is used to adjust the temperature of the experimental environment to obtain sufficient charge injec...
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