14 results about "Surface potential measurement" patented technology

The invention discloses an insulator surface potential measuring device and method, and the device comprises a housing which is provided with a sealed cavity, an air inlet, and an air outlet. The high-voltage wiring assembly is mounted on the shell, one end of the high-voltage wiring assembly extends into the cavity, and the other end of the high-voltage wiring assembly is externally connected with a high-voltage power supply; one end of the vacuumizing assembly penetrates through the shell and extends into the cavity; the electrostatic probe assembly comprises an electrostatic probe and a driving structure, the electrostatic probe and the driving structure are installed in the cavity, and the electrostatic probe is connected with the driving structure; the first central high-voltage conductor assembly is arranged in the cavity and is connected with one end of the high-voltage wiring assembly; the second central high-voltage conductor assembly is arranged in the cavity and is opposite to the first central high-voltage conductor assembly; and the second central high-voltage conductor is mounted on the first driving assembly. According to the invention, the limitation of measuring the surface potential of the insulator in a complex geometrical shape in the prior art is solved, and the measurement efficiency is improved through the control.

The invention provides a sleeve core surface potential measuring device and method based on an electrostatic probe method. The device comprises a test cavity, a guide rod, a high-voltage wiring assembly, a glass fiber reinforced plastic cylinder, a driving device and a self-movable measuring structure, the side wall of the test cavity is provided with an extraction opening, an inflation opening and a cabin door capable of being opened and closed; the first end of the high-voltage wiring assembly is arranged in the test cavity; the glass fiber reinforced plastic cylinder is arranged in the test cavity; the first end of the guide rod is movably arranged in the glass fiber reinforced plastic cylinder in a penetrating manner and is in sliding connection with the first end of the high-voltage wiring assembly, and the guide rod bears a tested core body; the driving device drives the guide rod to move so as to enable the measured core body to move from the pressurizing position to the measuring position, and drives the guide rod to rotate so as to drive the measured core body to rotate; the measuring structure measures the surface potential of the measured core body at the measuring position. According to the invention, the surface potential of the measured core can be comprehensively scanned, the accuracy of surface potential measurement is improved, and automatic measurement of the measured core can be realized.

The invention belongs to the technical field of extra-high voltage equipment testing, and discloses a device for surface potential measurement and a processing device and method.The device comprises an electrostatic probe and a sealing cavity, the sealing cavity is provided with a port, and the port of the sealing cavity is provided with a sealing flange in a sealed mode; one end of the electrostatic probe is arranged in the sealing cavity, and all signal lines of the electrostatic probe penetrate through the sealing flange and extend out of the sealing cavity; the portions, penetrating through the sealing flange, of all the signal lines are connected with a sealing block in a sealed mode, a gap is formed between any two signal lines, and the space between any two signal lines is filled with materials of the sealing block. The sealing block is hermetically connected with the sealing flange; the sealing cavity or the sealing flange is provided with an inflation and deflation nozzle. According to the invention, under the condition that a probe signal line is not cut off, the static probe passes through the sealed cavity, and stable measurement of the surface potential of the insulation equipment in an SF6 environment is realized.

The present invention discloses a method for locating the three-dimensional coordinates of electrodes in the human body based on surface potential measurement. A constant current is circulated on the electrodes on the body surface to measure the potentials of other electrodes on the body surface. A three-dimensional coordinate positioning model of the human body is established by assigning values ​​and spatial coordinates to the current injection, collecting the electrode point potential data set, and the human body electrical impedance model. After the three-dimensional geometric model of the human body is established, a grid is divided, and a corresponding electrical impedance value is assigned to each area. The three-dimensional coordinate position of the electrodes in the human body is solved using the finite element method. The electrode position is displayed on a three-dimensional image using an image processing method. The absolute three-dimensional coordinate position and relative position of the electrode position in the human body can be determined through the image. This method for locating the three-dimensional coordinates of electrodes in the human body does not require large-scale surgical incision, is low-cost, and fast, and can achieve coordinate positioning of electrodes in the human body under minimally invasive surgery.

The invention discloses a dielectric material surface charge quantitative measurement method and system based on a KPFM-AM mode, and relates to the fields of friction catalysis technologies, friction nano-generators and the like. According to the method, the incidence relation between the surface potential and the surface charge density is deduced by deeply analyzing the vibration characteristics of the probe driven by the electric field force. On the basis, a series of finite element simulation is carried out by using COMSOL software, and the actual measurement process of the KPFM is simulated: on one hand, the applicability of a theoretical formula in an infinite uniform charged surface scene is verified, and on the other hand, the influence rule of a limited surface or a surface with non-uniform charge distribution on a surface potential measurement result is explored. Meanwhile, simulation analysis is conducted on the surface potential distribution of the point charges, and a fitting formula based on a Lorentz function is provided and used for accurate calculation of the surface potential distribution. Finally, on the basis of the theory and simulation results, a special program capable of inversely calculating the surface charge distribution according to the surface potential distribution is developed, and an important theoretical support and a practical tool are provided for efficient and accurate characterization of dielectric material surface electrical properties.

The present application relates to monitoring and monitoring methods for chromium-free anodization sealing processes. A method for in-situ monitoring and optimization of a sealing process, the method comprising: sealing a surface of an anodized substrate, providing a test anodized substrate corresponding to the anodized substrate into the same sealing process as the anodized substrate, measuring an electrochemical surface potential of the test anodized substrate representative of a surface of the anodized component, collecting the electrochemical surface potential measurement data, analyzing the electrochemical surface potential measurement data, and identifying one or more performance indicators related to sealing quality and process parameters. The method can comprise: using information obtained from analyzing the electrochemical surface potential measurement data to optimize the sealing process, measuring the electrochemical surface potential using a potentiostat and a reference electrode, and measuring the electrochemical surface potential of the test anodized substrate representative of a surface of the anodized component.

The invention provides a carrier migration speed testing method and device based on a scanning probe microscope, and the method comprises the steps: converting an obtained time domain vibration signal of a probe on the scanning probe microscope when the probe vibrates on the surface of a sample to be tested into a frequency domain, and carrying out the first denoising processing of the frequency domain vibration signal, performing filtering processing on the denoised frequency domain vibration signal through band-pass filtering, calculating an electrostatic force borne by the probe according to the filtered frequency domain vibration signal and a frequency response function, generating a surface potential evolution picture according to the surface potential of the to-be-detected sample determined based on the electrostatic force, making an equipotential line on the surface potential evolution picture, and determining the surface potential of the to-be-detected sample according to the equipotential line. And calculating the carrier migration speed based on an equipotential line on the surface potential evolution picture. According to the invention, the problems of low time resolution, low noise removal pertinence and non-ideal effect of surface potential measurement are solved through a band-pass filtering mode, so that carriers with relatively fast migration can be measured, and the problem that the carriers with relatively fast migration are difficult to measure is solved.

Provided are a plasma processing apparatus and a control method for ascertaining a state of plasma.　The plasma processing apparatus comprises: a plasma processing chamber; a base disposed in the plasma processing chamber; an electrostatic chuck disposed on an upper portion of the base and including a plurality of divided regions; an attraction electrode disposed in the electrostatic chuck; a heater electrode disposed below the attraction electrode for each of the plurality of divided regions; a heater power supply electrically connected to the heater electrode; a surface potential measurement device electrically connected to the attraction electrode and having a surface potential meter; and a control unit, wherein the control unit calculates a plasma state from a set value of power applied to the heater electrode from the heater power supply and a potential measured by the surface potential meter.

The invention provides a surface potential measurement method and device based on a scanning probe microscope, and the method comprises the steps: obtaining a time domain vibration signal of a probe on the scanning probe microscope when the probe vibrates on the surface of a sample to be measured, carrying out the frequency domain transformation processing of the time domain vibration signal, carrying out the first denoising processing of the frequency domain vibration signal, and carrying out the second denoising processing of the frequency domain vibration signal; carrying out filtering processing on the denoised frequency domain vibration signal through band-pass filtering; and calculating electrostatic force according to the filtered frequency domain vibration signal and a pre-tested frequency response function of the probe, and determining the surface potential of the to-be-tested sample based on the electrostatic force. According to the invention, after the frequency-domain vibration signal of the probe is denoised for the first time, the frequency-domain vibration signal after preliminary denoising is denoised again in a band-pass filtering mode, so that the signal-to-noise ratio of the vibration data of the probe can be improved, the denoising pertinence is enhanced, the denoising effect is improved, and the reliability of the probe is improved. Therefore, the problem of low time resolution of surface potential measurement in the prior art can be solved.

The present invention has: a measurement probe (4) that is disposed in contact with a plurality of conductive field plates (13) provided along the surface of an element (1) to be measured; a dummy electrode (5) that is electrically connected to the measurement probe (4) via an electric wire (6); and a surface electrometer (8) that measures the surface potential of the dummy electrode (5) by means of a probe (7). A sealing material (2) is accommodated in a container (3) in which the element (1) to be measured is accommodated, so as to cover the element (1) to be measured and the tip portion of the measurement probe (4).

This invention discloses an insulator surface potential measuring device and method, comprising a housing having a sealed cavity, an air inlet, and an exhaust outlet; a high-voltage wiring assembly installed in the housing, with one end of the high-voltage wiring assembly extending into the cavity and the other end connected to a high-voltage power supply; a vacuum pump assembly with one end extending through the housing into the cavity; an electrostatic probe assembly including an electrostatic probe and a driving structure, the electrostatic probe and the driving structure being installed in the cavity and connected; a first central high-voltage conductor assembly disposed in the cavity and connected to one end of the high-voltage wiring assembly; a second central high-voltage conductor assembly disposed in the cavity and opposite to the first central high-voltage conductor assembly; and a first driving assembly, with the second central high-voltage conductor mounted on the first driving assembly. This invention overcomes the limitations of existing technologies in measuring the surface potential of insulators with complex geometries and improves measurement efficiency through the aforementioned control.

To provide a surface potential measuring apparatus capable of accurately measuring the surface potential of a measurement target even when a noise generation source that generates electrical noise exists near a measurement target.SOLUTION: A surface potential measuring apparatus that detects the surface potential of a measurement target surface 2a provided near a noise generation source 3 that generates electrical noise comprises: a detection electrode 6 that faces the measurement target surface 2a and detects the surface potential of the measurement target surface; and a noise reduction electrode 5 that inputs electric line force with the reverse polarity to the electric line force input to the detection electrode 6 from the noise generation source 3 to the detection electrode.SELECTED DRAWING: Figure 1

This invention discloses a method and system for quantitative measurement of surface charge on dielectric materials based on the KPFM-AM mode, relating to tribocatalysis technology, triboelectric nanogenerators, and other fields. By deeply analyzing the probe vibration characteristics driven by an electric field, this invention derives the correlation between surface potential and surface charge density. Based on this, a series of finite element simulations are conducted using COMSOL software to simulate the actual KPFM measurement process: on the one hand, verifying the applicability of the theoretical formula in the scenario of an infinitely large uniformly charged surface; on the other hand, exploring the influence of finite-sized or non-uniformly charged surfaces on the surface potential measurement results. Simultaneously, simulation analysis is performed on the surface potential distribution of point charges, and a fitting formula based on the Lorentz function is proposed for accurate calculation of the surface potential distribution. Finally, based on the above theory and simulation results, a dedicated program is developed that can inversely calculate the surface charge distribution from the surface potential distribution, providing important theoretical support and practical tools for the efficient and accurate characterization of the surface electrical properties of dielectric materials.

To provide a surface potential measurement device capable of performing correct measurement even under vacuum requiring static elimination by using plasma.SOLUTION: A surface potential measurement device includes: a grounding metal case 1 having an opening detection window 2; a detection electrode 5 arranged inside the case 1 and positioned to correspond to the detection window 2; a detection circuit to which the detection electrode 5 is connected; and an electrically insulating substrate 6 for supporting the detection electrode and the detection circuit. The case 1 includes permanent magnets M1, M2, and a magnetic field line B passes over the detection window 2.SELECTED DRAWING: Figure 2