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Measuring device and measuring method for trap parameter of solid dielectric material

A technology of solid dielectric and trap parameters, which is applied in the direction of measuring devices, material analysis and material analysis through electromagnetic means, can solve the problems of easy flashover discharge and easy occurrence, and achieve the effect of uniform surface charging effect

Inactive Publication Date: 2012-12-26
XI AN JIAOTONG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Zhang Guanjun and others from Xi’an Jiaotong University believe that traps with different energy levels may have different contributions to the progress of flashover. The low-energy traps are easy to release short-term charges after capturing charges, which can easily cause flashover discharge (the views of Li Chengrong and Ding Lijian of North China Electric Power University and This is consistent), and the deeper level traps have a certain effect on suppressing the secondary electron emission on the surface of the material. By increasing the density of the deep traps, the flashover voltage along the surface can be increased to a certain extent, but due to the distortion effect of the trap charges on the electric field , will make subsequent flashovers prone to occur once flashovers occur

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  • Measuring device and measuring method for trap parameter of solid dielectric material
  • Measuring device and measuring method for trap parameter of solid dielectric material
  • Measuring device and measuring method for trap parameter of solid dielectric material

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Embodiment Construction

[0047] The present invention will be further described in detail below in conjunction with specific embodiments, which are explanations of the present invention rather than limitations.

[0048] see figure 1 , a solid dielectric material trap parameter measurement device, including a three-electrode corona charging unit and a surface potential attenuation measurement unit arranged in a constant temperature box 12;

[0049] The three-electrode corona charging unit includes a metal disc electrode 6, a metal mesh electrode 4 and a needle electrode 3 from bottom to top, wherein the metal disk electrode is grounded 6, and the metal mesh electrode 4 and the needle electrode 3 are respectively connected to the bias DC The power supply 2 is connected to the DC charging power supply 1;

[0050] The surface potential attenuation measurement unit includes a capacitive electrostatic probe 8 arranged on an insulating support 13 , and the capacitive electrostatic probe 8 is connected to a ...

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Abstract

The invention discloses a measuring device and method for a trap parameter of solid dielectric. The solid dielectric material is charged by using a three-electrode corona discharge system; a material sample to be tested is placed below a single-needle electrode and a metal mesh electrode; the sample is adhered to a metal disc electrode through conductive silicone grease and is charged by the three-electrode system; after charging is ended, an external voltage is removed, and short circuit discharge is performed to remove surface free loads; surface potential of the measured sample is attenuated; and the trap energy level and the trap density parameter of the material can be calculated through a signal conditioning circuit and a data acquisition system. The measuring device comprises a constant temperature box, the three-electrode coronate charging system, a surface potential measuring system, a sample preheating system, a rotary electrode and a temperature and humidity control system. The invention provides an effective analysis means for research in representation of an aging condition of a polymer insulating material and an aging rule of polymer by the trap parameter and research in aspects such as a solid dielectric surface electrification phenomenon and surface flashover performance influence.

Description

technical field [0001] The invention belongs to the technical field of measuring trap characteristics of dielectric materials, and relates to a device and method for measuring trap parameters of solid dielectric materials. Background technique [0002] Polymer insulating materials have good dielectric properties such as high DC resistance, low dielectric loss, good thermal stability and excellent machinability, so they are widely used in the field of electrical insulation. However, with the improvement of the voltage level of the power system and the development of DC transmission technology, the space charge effect of polymer insulation has become more and more prominent, which leads to the distortion of the internal electric field of the polymer material, causing partial discharge and the development of electric trees, resulting in polymer materials. Aging problem, how to suppress and eliminate the space charge in polymer insulation has become a research hotspot in the fie...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/60
Inventor 申文伟张冠军穆海宝邓军波
Owner XI AN JIAOTONG UNIV
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