Backscattering cross section measuring method based on trace scanning two-dimensional near field imaging
A technology of backscattering and measurement methods, which is applied in the direction of radio wave reflection/re-radiation, radio wave measurement systems, and measurement devices. It can solve the problems of long circular scanning measurement time and affecting test efficiency, and achieves strong confidentiality. , the effect of high space utilization
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[0019] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be noted that, in the drawings or descriptions of the specification, similar or identical parts all use the same figure numbers. Implementations not shown or described in the accompanying drawings are forms known to those of ordinary skill in the art. Additionally, while illustrations of parameters including particular values may be provided herein, it should be understood that the parameters need not be exactly equal to the corresponding values, but rather may approximate the corresponding values within acceptable error margins or design constraints.
[0020] The backscattering cross-section measurement method based on two-dimensional near-field imaging of trace scanning according to the present invention, af...
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