Multi-channel detecting system for detecting optical performance of LED chip

Abstract

A multi-channel detecting system for detecting the optical performance of an LED chip is characterized in that the system comprises a PCB, a sample table, a plurality of electrodes, a connecting plug, an electrical detecting unit, an optical detecting unit and a point connecting device; the sample table is arranged at the center of the PCB and is used for mounting the LED chip; the electrodes are arranged around the PCB; the connecting plug is electrically connected with the electrodes; the electrical detecting unit comprises a voltage meter, a current source, a switch matrix and an output plug, the voltage meter and the current source are electrically connected with the output plug through the switch matrix, and the switch matrix converts the electrical connection of all pins in the output plug; the point connecting device comprises a spot-welder and a metal wire, and the spot-welder is used for enabling the two ends of the metal wire to be connected with the electrodes and the LED chip respectively. The multi-channel detecting system is used for directly detecting the LED chip.

Description

technical field [0001] The invention relates to a detection system for LED chips, in particular to a multi-channel detection system for LED chips. Background technique [0002] Semiconductor light-emitting diodes (LEDs) have many new problems in quality evaluation and detection methods due to their small size, directional emission, high brightness, and PN junction electrical characteristics. Different applications determine the performance requirements of LED products. From the perspective of optical performance, LEDs used for display mainly include parameters such as brightness, viewing angle distribution, and color. LEDs used for general lighting pay more attention to parameters such as luminous flux, spatial distribution of light beams, color, and color rendering characteristics, while LEDs used in biological applications pay more attention to parameters such as biological effective radiation power and effective radiation illuminance. In addition, a light-emitting diode...

AI Technical Summary

Problems solved by technology

The wireless probe card method needs to add additional sending and receiving circuits on the chip to realize the function detection of the chip, which is costly and inefficient

The laser SQUID method realizes the detection of the pn junction by non-contact measurement of the magnetic field distribution generated by the photocurrent, but due to the extremely weak change of the magnetic field, a superconducting quantum magnetometer (SQUID) must be used, and the detection instrument system is very complicated and expensive

The two types of detection methods mentioned above are mainly used for the detection of LED epitaxial wafers, chips and finished products. At present, there is no suitable method for testing semi-finished LED chips before packaging at home and abroad.

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