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A fault detection and repair method for on-orbit sram type fpga based on configuration frame

A fault detection and repair method technology, applied in the field of satellite control systems, can solve problems such as too large configuration information, achieve the effects of improving error detection speed, realizing dynamic fault repair design, and improving detection rate and repair ability

Active Publication Date: 2018-07-24
BEIJING INST OF CONTROL ENG
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Problems solved by technology

[0004] The object of the present invention is to overcome the above-mentioned deficiency of prior art, provide a kind of SRAM type FPGA fault detection and repair method based on configuration frame, this method makes up for the deficiency of SRAM type FPGA space anti-radiation ability, solves the problem of SRAM type FPGA Because the configuration information is too large, it is impossible to quickly and flexibly realize fault detection and repair, etc., providing a general reliability design method for SRAM FPGA with simple implementation, low resource consumption rate, and no software support

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  • A fault detection and repair method for on-orbit sram type fpga based on configuration frame

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Embodiment Construction

[0029] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0030] Such as figure 1 Shown is the principle diagram of the fault detection and repair method of the present invention. The present invention is based on the configuration frame-based on-track SRAM FPGA fault detection and repair method, which is realized by the fault detection and repair system. The fault detection and repair system includes: a main processing module, a configuration Frame readback module, fault detection module and configuration frame error correction and recovery module, wherein the fault detection module includes configuration frame CRC check operation module, detection configuration interface module, working status and function detection module and verification module, configuration frame error correction The recovery module includes a configuration frame write-back module and a configuration frame rewrite module. The mai...

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Abstract

The invention relates to an on-rail SRAM type FPGA fault detection and repair method based on a configuration frame, which is realized by a fault detection and repair system. The fault detection and repair system includes a main processing module, a configuration frame readback module, a fault detection module and a configuration frame Error correction and recovery module, the present invention implements frame-by-frame readback, verification and writeback or rewrite of the internal configuration information of SRAM FPGA through the fault detection and repair system implemented on the highly reliable chip, and realizes configuration information frame The level of fault detection and repair greatly improves the detection rate and repair ability of the configuration information flip problem caused by the single event effect of the space environment. A general reliability design approach supported by software.

Description

technical field [0001] The invention relates to an on-orbit SRAM type FPGA fault detection and repair method based on a configuration frame, and belongs to the technical field of satellite control systems. Background technique [0002] With the development of the aerospace industry, miniaturization and system integration have become the main trend of satellite development, which requires the electronic components used must have the characteristics of high integration and small size, which makes Field Programmable Gate Array FPGA (Field Programmable Gate Array) ) has become the main device of star electronic products. [0003] In space applications, the most used FPGA is based on the CMOS SRAM process, but when the SRAM FPGA is used in the space environment, space high-energy particles will penetrate the interior of the FPGA device and generate ionization on the path, and the internal circuit nodes will be due to The diffusion and drift of electrons or holes generated by ion...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03K19/177
Inventor 施蕾杨孟飞董暘暘刘波胡洪凯叶有时吴一帆孙强熊军夏冰冰
Owner BEIJING INST OF CONTROL ENG
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