Test system and test method for signal-noise ratio of low-light ICCD (Intensified Charge Coupled Device)

A test system and signal-to-noise ratio technology, which is applied to the measurement circuit and the use of electrical radiation detectors for photometry, etc., can solve the problems of no established ICCD performance parameter standards, no low-light ICCD signal-to-noise ratio test method, etc. Achieve continuous change and precise control, good stability and repeatability

Active Publication Date: 2015-05-20
NANJING UNIV OF SCI & TECH
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Problems solved by technology

[0003] In China, some units have carried out the research work of ICCD performance parameter test, but the standard of ICCD performance parameter has not been established, and there is no relevant literature on the low-light ICCD signal-to-noise ratio test method

Method used

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  • Test system and test method for signal-noise ratio of low-light ICCD (Intensified Charge Coupled Device)
  • Test system and test method for signal-noise ratio of low-light ICCD (Intensified Charge Coupled Device)
  • Test system and test method for signal-noise ratio of low-light ICCD (Intensified Charge Coupled Device)

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Embodiment

[0034] The present invention is based on the above structure, and the working principle of the testing system is as follows: first, place the low-light ICCD in the dark box, and turn on the tungsten-halogen light source switch. The power supply voltage of the halogen tungsten light source is 24V, and the power is 50W. In the case of a uniform light source incident, add a working voltage of 12V to the low-light ICCD. When the output current of the light source is stable at 2.083A, the color temperature of the light source is basically stable at 2856K±50K, and only then can the low-light ICCD signal-to-noise ratio test be performed.

[0035] Secondly, the double integrating sphere system is composed of wedge-shaped gradient diaphragm, variable aperture diaphragm and two integrating spheres, and the light generated by the halogen tungsten light source enters the double integrating sphere system. to 10 -4 Ix illuminance is used as the test condition of low-light ICCD. By changin...

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Abstract

The invention discloses a test system and a test method for a signal-noise ratio of a low-light ICCD (Intensified Charge Coupled Device) and relates to the test system and the specific test method for the signal-noise ratio. The test method comprises the following steps of putting ICCD in a dark box, irradiating ICCD by using uniform light, applying working voltage to the ICCD and enabling the ICCD to work normally; adjusting a gradient wedge diaphragm and an aperture-variable diaphragm to change intensity of illumination, and collecting image signals of ICCD to obtain an average signal value and a noise root-mean-square value; calculating the signal-noise ratio value of ICCD through data processing. The test method can scientifically evaluate the noise characteristic of ICCD and can be widely applied to development and production of low-light devices.

Description

technical field [0001] The invention belongs to the technical field of low-light testing, in particular to a low-light ICCD signal-to-noise ratio testing system and testing method. Background technique [0002] The signal-to-noise ratio of low-light ICCD is the main parameter to evaluate the noise performance of low-light ICCD. At present, foreign companies with ICCD production technology usually provide the performance indicators of low-light image intensifiers and CCDs separately. The ability to directly test ICCD performance parameters may be based on confidentiality reasons, so the performance indicators and test methods of low-light ICCD are not directly given. At present, there is no report on the test of microscopic ICCD performance parameters in foreign countries, and there is no mention of the detection technology and method of the signal-to-noise ratio. [0003] In China, some units have carried out the research work of ICCD performance parameter test, but the st...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/44
Inventor 钱芸生史继芳邱亚峰王生云富容国李琪孙宇楠刘健徐茜茜王丽
Owner NANJING UNIV OF SCI & TECH
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