Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Inductor in three-dimensional stack package chip and its preparation method

A technology of three-dimensional stacking and mounting chips, which is applied in the direction of circuits, electrical components, and electrical solid devices, can solve the problems of low inductance, limited inductance size, and inability to meet high inductance and high Q value, etc., to increase the chip plane area, the effect of increasing the inductance value

Active Publication Date: 2018-03-06
WUHAN XINXIN SEMICON MFG CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The number of turns and the size of the turns affect the inductance of the inductor. However, with the rapid development of integrated circuits, more devices need to be integrated on the chip, making the size of the devices smaller and smaller, thus limiting the number of turns of the inductor With the size of the turns, the inductance caused by the inductor is not high
Moreover, in radio frequency (RF) integrated circuits, due to the need to implant heavy ion doping in the substrate, the resistance of the substrate is lost, resulting in a radio frequency (RF) integrated circuit, the Q value of the inductor is relatively lower
Therefore, the inductors of the prior art cannot meet the demands of high inductance (greater than 10nH) and high Q value (greater than 20)

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Inductor in three-dimensional stack package chip and its preparation method
  • Inductor in three-dimensional stack package chip and its preparation method
  • Inductor in three-dimensional stack package chip and its preparation method

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0041] According to the core idea of ​​the present invention, a preparation method is also provided, such as figure 1 shown, including:

[0042] Step S11 : providing a first wafer, including a first substrate and a first dielectric layer on one side of the first substrate, a first inductor is formed in the first dielectric layer, and the first dielectric layer A first conductive plug is provided on a side away from the first substrate, and the first conductive plug is connected to the first inductor;

[0043] Step S12 : providing a second wafer, including a second substrate and a second dielectric layer on one side of the second substrate, a second inductor is formed in the second dielectric layer, and the second dielectric layer A side away from the second substrate is provided with a second conductive plug, the second conductive plug is connected to the second inductor;

[0044] Step S13 : bonding the first wafer and the second wafer together, wherein the side of the first d...

no. 1 example

[0047] below, see Figure 2-Figure 4 The inductor in the three-dimensional stacked package chip of the present invention and its manufacturing method are specifically described. In this embodiment, the inductor consists of two stacked sub-inductors, and the two sub-inductors are located in two stacked wafers respectively.

[0048] First, as figure 2 As shown, step S11 is performed to provide a first wafer 100 . The first wafer 100 includes a first substrate 110 and a first dielectric layer 120 located on one side of the first substrate 110 . The thickness of the first substrate 110 is generally thick, about 500 μm˜800 μm, such as 500 μm, 600 μm, 700 μm, etc. The material of the first dielectric layer 120 is generally oxide. A first inductor 121 is formed in the first dielectric layer, wherein the first wafer 100 is formed by an integrated circuit process, and the first dielectric layer 120 and the first inductor 121 pass through the BEOL (after The specific interconnection ...

no. 2 example

[0058] see Figure 5-Figure 10 , Figure 5-Figure 10 It is a schematic cross-sectional view of the chip in the manufacturing process of the inductor in the three-dimensional stacked package chip according to the second embodiment of the present invention. The inductor 2 of the second embodiment is basically the same as the inductor 1 of the first embodiment, and the difference is that after step S13, it further includes:

[0059] like Image 6 As shown, the side of the first substrate 110 away from the first dielectric layer 120 is thinned, and the thickness of the first substrate 110 is reduced to 2 μm˜5 μm, which is beneficial to the preparation of the third conductive plug .

[0060] Then, as in Figure 7 As shown, an opening 126 is formed on the first substrate 110 away from the first dielectric layer 120, such as Figure 8 As shown, the openings 126 are filled with conductive materials to form third conductive plugs 127 . In this embodiment, the third conductive plu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an inductor in a three-dimensional stack package chip, comprising: a first wafer including a first inductor; a second wafer including a second inductor; the first wafer is bonded to the second wafer Taken together, the first inductor and the second inductor are connected in series. The invention also improves a method for preparing the inductor. In the above inductance, the first inductance and the second inductance are connected in series to increase the inductance value of the inductance without increasing the planar area of ​​the chip.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to an inductor in a three-dimensional stacked package chip and a preparation method thereof. Background technique [0002] Inductors are used in a wide variety of integrated circuit applications. An on-chip inductor is a passive electrical component that can store energy in a magnetic field created by an electrical current passing through it. An inductance may be a conductor in the form of a coil that includes one or more "turns." The turns concentrate the magnetic field flux induced by the current flowing through each turn of the conductor into an "inductive" region within the inductive turns. [0003] The number of turns and the size of the turns affect the inductance of the inductor. However, with the rapid development of integrated circuits, more devices need to be integrated on the chip, making the size of the devices smaller and smaller, thus limiting the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/64H01L21/02
Inventor 鞠韶复朱继锋梅绍宁刘威
Owner WUHAN XINXIN SEMICON MFG CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com